| Title |
Authors | Affiliation | Journal |
|---|
| Apparent tunnel barrier heights of Ptlr-Au interfaces in relation
to the Au surface composition | Boyer L (REPRINT) ; Noel S; Houze
F | UNIV PARIS 06,URA CNRS 0127, LAB GENIE ELECT PARIS, PLATEAU
MOULON/F-91192 GIF SUR YVETTE//FRANCE/ (REPRINT); UNIV PARIS
11,SUPELEC/F-91192 GIF SUR YVETTE//FRANCE/ | JOURNAL OF VACUUM
SCIENCE & TECHNOLOGY B, 1998, V16, N4 (JUL-AUG) , P2006-2012 |
| A hydrothermal atomic force microscope for imaging in aqueous
solution up to 150 degrees C | Higgins SR (REPRINT) ; Eggleston
CM; Knauss KG; Boro CO | UNIV WYOMING,DEPT GEOL &
GEOPHYS/LARAMIE//WY/82071 (REPRINT); LAWRENCE LIVERMORE NATL LAB,DIV EARTH
SCI/LIVERMORE//CA/94550 | REVIEW OF SCIENTIFIC INSTRUMENTS, 1998,
V69, N8 (AUG), P2994-2998 |
| Design, operation, and
housing of an ultrastable, low temperature, ultrahigh vacuum scanning
tunneling microscope | Ferris JH; Kushmerick JG; Johnson JA;
Youngquist MGY; Kessinger RB; Kingsbury HF; Weiss PS (REPRINT)
| PENN STATE UNIV,DEPT CHEM/UNIVERSITY PK//PA/16802 (REPRINT); PENN
STATE UNIV,DEPT CHEM/UNIVERSITY PK//PA/16802; PENN STATE UNIV,EBERLY COLL
SCI/UNIVERSITY PK//PA/16802; PENN STATE UNIV,DEPT ARCHITECTURAL
ENGN/UNIVERSITY PK//PA/16802 | REVIEW OF SCIENTIFIC INSTRUMENTS,
1998, V69, N7 (JUL), P2691-2695 |
| The use of scanning
probe microscopy in surface finishing and engineering | Smith JR
(REPRINT) ; Campbell SA; Walsh FC | UNIV PORTSMOUTH,SCANNING PROBE
MICROSCOPY LAB, ST MICHAELS BLDG, WHITE SWAN RD/PORTSMOUTH PO1
2DT/HANTS/ENGLAND/ (REPRINT); UNIV PORTSMOUTH,APPL ELECTROCHEM
GRP/PORTSMOUTH PO1 2DT/HANTS/ENGLAND/ | TRANSACTIONS OF THE
INSTITUTE OF METAL FINISHING, 1998, V76, 4 ( JUL), P53-61 |
| Photon emission excited in paraffin-passivated GaAs surfaces by
scanning tunneling microscopy | Carladous A (REPRINT) ; Coratger
R; Seine G; Ajustron F; Beauvillain J | CNRS,CEMES, 29 RUE J
MARVIG, BOITE POSTALE 4347/F-31055 TOULOUSE//FRANCE/ (REPRINT)
| JOURNAL OF APPLIED PHYSICS, 1998, V84, N2 (JUL 15), P1085-1089
|
| Length measurement using a regular crystalline lattice
and a dual tunnelling unit scanning tunnelling microscope in a
thermo-stabilized cell | Aketagawa M (REPRINT) ; Takada K;
Kobayashi K; Takeshima N; Noro M; Nakayama Y | NAGAOKA UNIV
TECHNOL,1603-1 KAMITOMIOKA/NAGAOKA/NIIGATA 94021/JAPAN/ (REPRINT); HITACHI
LTD,CENT RES LAB/TOKYO 187//JAPAN/ | MEASUREMENT SCIENCE &
TECHNOLOGY, 1998, V9, N7 (JUL), P1076-1081 |
| In situ
scanning force microscopy (SFM) study of the electrochemical activations
of carbon fibres | Zhdan PA; Bors M; Castle JE (REPRINT)
| UNIV SURREY,DEPT MAT SCI & ENGN/GUILDFORD GU2 5XH/SURREY/ENGLAND/
(REPRINT); UNIV SURREY,DEPT MAT SCI & ENGN/GUILDFORD GU2
5XH/SURREY/ENGLAND/ | COMPOSITES SCIENCE AND TECHNOLOGY, 1998, V58,
N3-4, P559-570 |
| Surface forces, surface chemistry and
tribology | Feldman K; Fritz M; Hahner G; Marti A (REPRINT) ;
Spencer ND | ETH ZENTRUM,SURFACE SCI & TECHNOL LAB, DEPT MAT, NO
H64/CH-8092 ZURICH//SWITZERLAND/ (REPRINT); ETH ZENTRUM,SURFACE SCI &
TECHNOL LAB, DEPT MAT/CH-8092 ZURICH//SWITZERLAND/ | TRIBOLOGY
INTERNATIONAL, 1998, V31, N1-3 (JAN-MAR), P99-105 |
|
Structure of adsorbates on electrode-in situ STM evaluation | Ye
S; Uosaki K | DENKI KAGAKU, 1998, V66, N2 (FEB), P145-150
|
| Interactions of DNA with fluorescent dyes: by scanning
tunneling microscopy | Zareie MH; Sahin FI; Ergun MA; Kocum C;
Menevse S; Menevse A; Piskin E (REPRINT) | UNIV HACETTEPE,DEPT
CHEM ENGN/TR-06100 ANKARA//TURKEY/ (REPRINT); UNIV HACETTEPE,DEPT CHEM
ENGN/TR-06100 ANKARA//TURKEY/; UNIV HACETTEPE,BIOENGN DIV/TR-06100
ANKARA//TURKEY/; GAZI UNIV,DEPT MED BIOL & GENET/ANKARA//TURKEY/
| INTERNATIONAL JOURNAL OF BIOLOGICAL MACROMOLECULES, 1998, V23, N1
(JUL), P7-10 |
| Development and investigation of a novel
scanning electrochemical microscope. | Kapui I (REPRINT) ; Nagy G;
Csany B; Toth K | TECH UNIV BUDAPEST,ALTALANOS & ANALIT KEMIA
TANSZEK/BUDAPEST//HUNGARY/ (REPRINT) | MAGYAR KEMIAI FOLYOIRAT,
1998, V104, N5 (MAY), P195-207 |
| Scanning probe
microscope studies of thermodynamic and kinetic processes in ultrathin
organic films | Schwartz DK (REPRINT) | TULANE UNIV,DEPT
CHEM/NEW ORLEANS//LA/70118 (REPRINT) | CURRENT OPINION IN COLLOID &
INTERFACE SCIENCE, 1998, V3, N2 (APR) , P131-136 |
| A new
method of superconducting energy gap spectroscopy | Gogadze GA
(REPRINT) ; Svistunov VM; Aoki R; Murakami H; Shirai M | NASU,B
VERKIN INST LOW TEMP PHYS & ENGN/UA-310164 KHARKOV//UKRAINE/ (REPRINT);
NASU,A GALKIN DONETSK PHYSICOTECH INST/UA-340114 DONETSK//UKRAINE/; OSAKA
UNIV,FAC ENGN, DEPT ELECT ENGN/SUITA/OSAKA 565/JAPAN/; COLL IND
TECHNOL,DEPT ELEC | PHYSICA C, 1998, V297, N3-4 (MAR 10), P232-238
|
| Direct length comparison between regular crystalline
lattice and SEM standard grating using dual tunneling unit STM |
Aketagawa M (REPRINT) ; Takada K; Sasaki S; Suzuki S; Kobayashi K; Yamada
K; Nakayama Y | NAGAOKA UNIV TECHNOL, DEPT MECH ENGN, KAMITOMIOKA
1603-1/NAGAOKA/NIIGATA 94021/JAPAN/ (REPRINT) | INTERNATIONAL
JOURNAL OF MACHINE TOOLS & MANUFACTURE, 1998, V38, N5-6 (MAY-JUN),
P677-683 |
| Ultralow-temperature atomic force microscopy
for the investigation of mesoscopic systems | Pelekhov DV
(REPRINT) ; Becker JB; Nunes G | DARTMOUTH COLL,DEPT PHYS & ASTRON,
WILDER LAB 6127/HANOVER//NH/03755 (REPRINT) | APPLIED PHYSICS
LETTERS, 1998, V72, N8 (FEB 23), P993-995 |
| Developments
and perspectives of scanning probe microscopy (SPM) on organic materials
systems | Jandt KD (REPRINT) | UNIV BRISTOL,DEPT ORAL &
DENT SERV, DENT MAT SCI & BIOMAT GRP, LOWER MAUDLIN ST/BRISTOL BS1
2LY/AVON/ENGLAND/ (
REPRINT); CORNELL UNIV,DEPT MAT SCI & ENGN/ITHACA//NY/14853; CORNELL
UNIV,CTR MAT SCI/ITHACA//NY/14853 | MATERIALS SCIENCE & ENGINEERING
R-REPORTS, 1998, V21, N5-6 (FEB) , P221-295 |
| Scanning
near-field fluorescence microscopy of a phase-separated
hydrocarbon-fluorocarbon mixed monolayer | Monobe H (REPRINT) ;
Koike A; Muramatsu H; Chiba T; Yamamoto N; Ataka T; Fujihira M
| TOKYO INST TECHNOL,DEPT BIOMOL ENGN, MIDORI KU, 4259
NAGATSUTA/YOKOHAMA/KANAGAWA 226/JAPAN/ (REPRINT); SEIKO INSTRUMENTS
INC,CTR TECHNOL/CHIBA 271//JAPAN/ | ULTRAMICROSCOPY, 1998, V71,
N1-4 (MAR), P287-293 |
| Application of scanning
near-field optical microscopy to thin organic film devices |
Fujihira M (REPRINT) ; Monobe H; Koike A; Ivanov GR; Muramatsu H ; Chiba
N; Yamamoto N; Ataka T | TOKYO INST TECHNOL,DEPT BIOMOL ENGN,
MIDORI KU, 4259 NAGATSUTA/YOKOHAMA/KANAGAWA 226/JAPAN/ (REPRINT); SEIKO
INSTRUMENTS INC,CTR TECHNOL/CHIBA 271//JAPAN/ | ULTRAMICROSCOPY,
1998, V71, N1-4 (MAR), P269-274 |
| Use of atomic force
microscopy for high-resolution non-invasive structural studies of human
hair | Smith JR (REPRINT) | UNIV PORTSMOUTH,SCH PHARM
BIOMED & PHYS SCI, SCANNING PROBE MICROSCOPY LAB, ST MICHAELS
BLD/PORTSMOUTH PO1 2DT/HANTS/ENGLAND/ (REPRINT) | JOURNAL OF THE
SOCIETY OF COSMETIC CHEMISTS, 1997, V48, N4 ( JUL-AUG), P199-208
|
| Surface roughness of orthodontic wires via atomic
force microscopy, laser specular reflectance, and profilometry |
Bourauel C (REPRINT) ; Fries T; Drescher D; Plietsch R | UNIV
BONN,DEPT ORTHODONT, WELSCHNONNENSTR 17/D-53111 BONN //GERMANY/ (REPRINT);
FORSCHUNGSZENTRUM KARLSRUHE,/D-76021 KARLSRUHE//GERMANY/ | EUROPEAN
JOURNAL OF ORTHODONTICS, 1998, V20, N1 (FEB), P79-92 |
|
Extracting adsorbate diffusion dynamics from an STM experiment: a Monte
Carlo study of flicker noise | Wander A; Harrison J; King DA
(REPRINT) | UNIV CAMBRIDGE,CHEM LAB, LENSFIELD RD/CAMBRIDGE CB2
1EW//ENGLAND/ (REPRINT); UNIV CAMBRIDGE,CHEM LAB/CAMBRIDGE CB2
1EW//ENGLAND/ | SURFACE SCIENCE, 1998, V397, N1-3 (FEB 1), P406-420
|
| Design of a simple and compact scanning tunneling
microscope | Lakshminarayanan V (REPRINT) | RAMAN RES
INST,/BANGALORE 560080/KARNATAKA/INDIA/ (REPRINT) | CURRENT
SCIENCE, 1998, V74, N5 (MAR 10), P413-417 |
| Use of high
energy boron ion irradiation to facilitate STM investigations of CVD
diamond | Sumant AV (REPRINT) ; Kshirsagar RB; Dharmadhikari CV;
Godbole VP | UNIV PUNVE,CTR ADV STUDIES MAT SCI & SOLID STATE PHYS,
DEPT PHYS/PUNE
411007/MAHARASHTRA/INDIA/ (REPRINT) | VACUUM, 1997, V48, N12
(DEC), P1005-1010 |
| Submicron deformation field
measurements: Part 1. Developing a digital scanning tunneling microscope
| Vendroux G (REPRINT) ; Knauss WG | CALTECH,GRAD AERONAUT
LABS/PASADENA//CA/91125 (REPRINT) | EXPERIMENTAL MECHANICS, 1998,
V38, N1 (MAR), P18-23 |
| Doping high T-c superconductors
with oxygen and metallic atoms: A molecular dynamics study | Stoll
E (REPRINT) ; Stern C; Singer J; Stucki P | UNIV ZURICH IRCHEL,INST
PHYS, WINTERTHURERSTR 190/CH-8057 ZURICH//SWITZERLAND/ (REPRINT); UNIV
ZURICH,INST INFORMAT, MULTIMEDIA LAB/CH-8057 ZURICH//SWITZERLAND/
| JOURNAL OF MATERIALS RESEARCH, 1997, V12, N11 (NOV), P2901-2906
|
| Evidence for layered growth of (100) textured diamond
films | Godbole VP (REPRINT) ; Sumant AV; Kshirsagar RB;
Dharmadhikari CV | UNIV PUNE,CTR ADV STUDIES MAT SCI & SOLID STATE
PHYS, DEPT PHYS/PUNE 411007/MAHARASHTRA/INDIA/ (REPRINT) | APPLIED
PHYSICS LETTERS, 1997, V71, N18 (NOV 3), P2626-2628 |
| A
flexible implementation of scanning probe microscopy utilizing a
multifunction system linked to a PC-Pentium controller | Barchesi
C (REPRINT) ; Cricenti A; Generosi R; Giammichele C; Luce M; Rinaldi M
| CNR,IST STRUTTURA MAT, VIA ENRICO FERMI 38/I-00044
FRASCATI//ITALY/ (REPRINT) | REVIEW OF SCIENTIFIC INSTRUMENTS,
1997, V68, N10 (OCT), P3799-3802 |
| The adsorption of
gold to galena surfaces: Calculation of adsorption/reduction energies,
reaction mechanisms, XPS spectra, and STM images | Becker U
(REPRINT) ; Hochella MF; Vaughan DJ | UNIV MUNSTER,INST
MINERAL/D-48149 MUNSTER/ /GERMANY/ (REPRINT); VIRGINIA POLYTECH INST &
STATE UNIV,DEPT GEOL SCI/BLACKSBURG//VA/24061; UNIV MANCHESTER,DEPT EARTH
SCI/MANCHESTER M13 9PL/LANCS/ENGLAND/ | GEOCHIMICA ET COSMOCHIMICA
ACTA, 1997, V61, N17 (SEP), P3565-3585 |
| Scanning
tunneling microscopy and spectroscopy study of Nd2-xCexCuO4-y |
Susla B (REPRINT) ; Czajka R; Sadowski W; Klimczuk T | POZNAN TECH
UNIV,INST PHYS, PIOTROWO 3/PL-60965 POZNAN//POLAND/ (REPRINT); UNIV
GDANSK,DEPT MATH & PHYS/PL-80952 GDANSK//POLAND/ | PHYSICA C, 1997,
V282, 3 (AUG), P1503-1504 |
| TEM moire patterns explain
STM images of bacteriophage T5 tails | Guenebaut V; Maaloum M;
Bonhivers M; Wepf R; Leonard K; Horber JKH (REPRINT) | EUROPEAN MOL
BIOL LAB,MEYERHOFSTR 1/D-69117 HEIDELBERG//GERMANY/ (REPRINT); EUROPEAN
MOL BIOL LAB,/D-69117 HEIDELBERG//GERMANY/; INST CHARLES SADRON,/F-67083
STRASBOURG//FRANCE/; UNIV PARIS 11,LAB BIOMEMBRANES, CNRS, URA
1116/F-91405 | ULTRAMICROSCOPY, 1997, V69, N2 (SEP), P129-137
|
| New technique for nanocantilever fabrication based on
local electrochemical etching: Applications to scanning force microscopy
| Hoummady M (REPRINT) ; Farnault E; Fujita H; Kawakatsu H;
Masuzawa T | UNIV TOKYO,INST IND SCI, CNRS, LAB INTEGRATED
MICROMECHATRON SYST, MINATO KU, 7-22-1 R/TOKYO 106//JAPAN/ (REPRINT)
| JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1997, V15, N4 (JUL-AUG)
, P1556-1558 Publication date: 19970700 |
| Imaging,
polymerization, and reconstruction of polystyrene films with a scanning
tunneling microscope | Hua ZY (REPRINT) ; Xu W | FUDAN
UNIV,DEPT MAT SCI/SHANGHAI 200433//PEOPLES R CHINA/ (REPRINT)
| JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1997, V15, N4 (JUL-AUG)
, P1353-1358 Publication date: 19970700 |
| Geometry
effects on the van der Waals force in atomic force microscopy |
Johansson P (REPRINT) ; Apell P | LUND UNIV,DEPT THEORET PHYS,
SOLVEGATAN 14A/S-22362 LUND//SWEDEN/ (REPRINT); EUROPEAN SYNCHROTRON
RADIAT FACIL,/F-38043 GRENOBLE//FRANCE/; CHALMERS UNIV TECHNOL,DEPT APPL
PHYS/S-41296
GOTHENBURG//SWEDEN/; GOTHENBURG UNIV,/S-41296 GOTH | PHYSICAL REVIEW
B-CONDENSED MATTER, 1997, V56, N7 (AUG 15), P 4159-4165 |
| Local electronic structure of metal particles on metal oxide
surfaces: Ni on alumina | Xu C (REPRINT) ; Lai XF; Goodman DW
| TEXAS A&M UNIV,DEPT CHEM/COLLEGE STN//TX/77843 (REPRINT)
| FARADAY DISCUSSIONS, 1996, N105, P247-261 |
|
Source of image contrast in STM images of
functionalized alkanes on graphite: A systematic functional group approach
| Claypool CL; Faglioni F; Goddard WA; Gray HB; Lewis NS (REPRINT)
; Marcus RA | CALTECH,DIV CHEM & CHEM ENGN/PASADENA//CA/91125
(REPRINT) ; CALTECH,DIV CHEM & CHEM
ENGN/PASADENA//CA/91125 | JOURNAL OF PHYSICAL CHEMISTRY B, 1997,
V101, N31 (JUL 31), P 5978-5995 |
| STM/AFM images and
tunneling spectra of Nd2-xCexCuO4-y single crystals | Susla B
(REPRINT) ; Sadowski W; Klimczuk T; Czajka R | POZNAN TECH
UNIV,INST PHYS, PIOTROWO 3/PL-60965 POZNAN//POLAND/ (REPRINT); GDANSK TECH
UNIV,DEPT APPL
MATH & PHYS/PL-80952 GDANSK//POLAND/ | ACTA PHYSICA POLONICA A,
1997, V92, N1 (JUL), P209-214 |
| Adsorption of biological
molecules to a solid support for scanning probe microscopy |
Muller DJ (REPRINT) ; Amrein M; Engel A | UNIV BASEL,BIOCTR, ME
MULLER INST MICROSCOPY, KLINGELBERGSTR 70/CH-4056 BASEL//SWITZERLAND/
(REPRINT);
JULICH//GERMANY/; UNIV MUNSTER,INST MED PHYS & BIOPHYS/D-48149
MUNSTER | JOURNAL OF STRUCTURAL BIOLOGY, 1997, V119, N2, P172-188
|
| Structural changes in native membrane proteins
monitored at subnanometer resolution with the atomic force microscope: A
review | Muller DJ (REPRINT) ; Schoenenberger CA; Schabert F;
Engel A | UNIV BASEL,BIOCTR, ME MULLER INST MICROSCOPY,
KLINGELBERGSTR 70/CH-4056 BASEL//SWITZERLAND/ (REPRINT); KFA
JULICH GMBH,FORSCHUNGSZENTRUM, IBI STRUCT BIOL 2/D-52425 JULICH//GERMANY/;
HUMBOLDT UNIV BERLIN,INST PHYS/D-10115 BERLIN//GERMA | JOURNAL OF
STRUCTURAL BIOLOGY, 1997, V119, N2,
P149-157 |
| Scanning probe microscopy studies of
Ebonex(R) electrodes | Smith JR (REPRINT) ; Nahle AH; Walsh FC
| UNIV PORTSMOUTH,SCH PHARM BIOMED & PHYS SCI, SCANNING PROBE
MICROSCOPY LAB/PORTSMOUTH PO1 2DT/HANTS/ENGLAND/ (REPRINT); UNIV
PORTSMOUTH,SCH PHARM BIOMED & PHYS SCI, APPL ELECTROCHEM GRP/PORTSMOUTH PO1
2DT/HANTS/ENGLAND/ | JOURNAL OF APPLIED ELECTROCHEMISTRY, 1997,
V27, N7 (JUL), P815-820 |
| Characterization of
organosulfur molecular monolayers on Au(111) using scanning tunneling
microscopy | Poirier GE (REPRINT)
| NIST,/GAITHERSBURG//MD/20899 (REPRINT) | CHEMICAL REVIEWS,
1997, V97, N4 (JUN), P1117-1127 |
| Cross-sectional
scanning tunneling microscopy | Yu
ET (REPRINT) | UNIV CALIF SAN DIEGO,DEPT ELECT & COMP ENGN/LA
JOLLA//CA/92093 (REPRINT) | CHEMICAL REVIEWS, 1997, V97, N4 (JUN),
P1017-1044 |
| 1 mu m range comparative length measurement
using a regular crystalline lattice and a dual tunneling unit scanning
tunneling microscope | Aketagawa M (REPRINT) ; Takada K; Suzuki S;
Sasaki S; Takahashi H | NAGAOKA UNIV TECHNOL,DEPT MECH ENGN,
1603-1 KAMITOMIOKA/NAGAOKA/NIIGATA 94021/JAPAN/ (REPRINT);
ORIENTAL MOTOR CO LTD,/KASHIWA/CHIBA 277/JAPAN/; TORAY ENGN CO
LTD,/NUMAZU/SHIZUOKA 410/JAPAN/; ANRITSU CORP,MINATO KU/TOKYO 106//JAPAN/
| JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1997, V15, N3
(MAY-JUN) , P574-578 Publication date: 19970500
|
| Subnanometer stability of nanostage supports |
vanderWulp H (REPRINT) ; Pistecky PV; Heerens WC | DELFT UNIV
TECHNOL,DEPT MECH ENGN & MARINE TECHNOL, LAB MICRO ENGN, MEKELWEG
2/NL-2628 CD DELFT//NETHERLANDS/ (REPRINT); DELFT UNIV
TECHNOL,DEPT APPL PHYS, PARTICLE OPT GRP/NL-2628 CJ DELFT//NETHERLANDS/
| JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1997, V15, N3 (MAY-JUN)
, P566-573 Publication date: 19970500 |
| Design of a
scanning tunneling microscope for in situ topographic and spectroscopic
measurements within a commercial molecular beam epitaxy machine |
Ventrice CA (REPRINT) ; LaBella VP; Schowalter LJ | UNIV NEW
ORLEANS,DEPT PHYS/
NEW ORLEANS//LA/70148 (REPRINT); RENSSELAER POLYTECH INST,DEPT PHYS APPL
PHYS & ASTRON/TROY//NY/12180 | JOURNAL OF VACUUM SCIENCE &
TECHNOLOGY A-VACUUM SURFACES AND FILMS , 1997, V15, N3,1 (MAY-JUN),
P830-835 |
| Overview of nanoelectronic devices |
GoldhaberGordon D (REPRINT) ; Montemerlo MS; Love JC; Opiteck GJ ;
Ellenbogen JC | MITRE CORP,7525 COLSHIRE DR/MCLEAN//VA/22102
(REPRINT) | PROCEEDINGS OF THE IEEE, 1997, V85, N4 (APR),
P521-540 |
| Surface crystalline gold silicide formation
on the Au(100) surface | Han J; Jeon D; Kuk Y (REPRINT)
| SEOUL NATL UNIV,DEPT PHYS/SEOUL 151742//SOUTH KOREA/ (REPRINT);
SEOUL NATL UNIV,DEPT PHYS/SEOUL 151742//SOUTH KOREA/; MYUNG JI
UNIV,DEPT PHYS/SEOUL 449728//SOUTH KOREA/ | SURFACE SCIENCE, 1997,
V376, N1-3 (APR 10), P237-244 |
| Morphology of lead(II)
and chromium(III) reaction products on phyllosilicate surfaces as
determined by atomic force microscopy | Gan H (REPRINT) ; Bailey
GW; Yu YS | ENGELHARD CORP,POB 337/GORDON//GA/31031 (REPRINT); US
EPA,NATL
RES COUNCIL/ATHENS//GA/30605; US EPA,ECOSYST RES DIV, NATL EXPOSURE RES
LAB/ATHENS//GA/30605; DYN CORP TECHNOL APPLICAT INC,/ATHENS//GA/30605
| CLAYS AND CLAY MINERALS, 1996, V44, N6 (DEC), P734-743 |
| AFM investigation of bismuth doped silicate glasses |
Czajka R (REPRINT) ; Trzebiatowski K; Polewska W; Koscielska B;
Kaszczyszyn S; Susla B | POZNAN TECH UNIV,INST PHYS, PIOTROWO
3/PL-60965 POZNAN//POLAND/ (REPRINT); GDANSK TECH
UNIV,DEPT APPL PHYS/PL-80233 GDANSK//POLAND/; UNIV WROCLAW,INST EXPT
PHYS/PL-50204 WROCLAW//POLAND/ | VACUUM, 1997, V48, N3-4 (MAR-APR),
P213-216 |
| Scanning tunneling spectroscopy sensitive to
layer structure of BSCCO | Aleszkiewicz M (REPRINT) ; Aleszkiewicz
P; Rauluszkiewicz J | POLISH ACAD SCI,INST PHYS, AL LOTNIKOW
32-46/PL-02668 WARSAW//POLAND/ (REPRINT) | ACTA PHYSICA POLONICA A,
1997, V91, N3 (MAR), P597-604 |
| Adsorption of thymine on
gold single-crystal electrodes | Roelfs B; Bunge E; Schroter C;
Solomun T; Meyer H; Nichols RJ; Baumgartel H (REPRINT) | FREE UNIV
BERLIN,TAKUSTR 3/D-14195 BERLIN//GERMANY/ (REPRINT); FREE UNIV
BERLIN,/D-14195 BERLIN//GERMANY/; ATOTECH DEUTSCHLAND GMBH,/D-10553
BERLIN//GERMANY/; UNIV LIVERPOOL,DEPT CHEM/LIVERPOOL L69
3BX/MERSEYSIDE/ENGLAND/ | JOURNAL OF PHYSICAL CHEMISTRY B, 1997,
V101, N5 (JAN 30), P754-765 |
| Current through a single
atom | Yamaguchi F (REPRINT) ; Yamamoto Y | STANFORD
UNIV,EDWARD L GINZTON LAB, ERATO, YAMAMOTO QUANTUM FLUCTUAT
PROJECT/STANFORD//CA/94305 (REPRINT); NIPPON TELEGRAPH & TEL PUBL
CORP,BASIC RES LABS/ATSUGI/KANAGAWA 24301/JAPAN/ | ELECTRONICS
LETTERS, 1996, V32, N24 (NOV 21), P2219-2221 |
| An
electromechanical amplifier using a single molecule | Joachim C;
Gimzewski JK (REPRINT) | IBM CORP,DIV RES, ZURICH RES LAB/CH-8803
RUSCHLIKON//SWITZERLAND/ (REPRINT); IBM CORP,DIV RES, ZURICH RES
LAB/CH-8803 RUSCHLIKON//SWITZERLAND/; CNRS,CEMES/F-31055
TOULOUSE//FRANCE/ | CHEMICAL PHYSICS LETTERS, 1997, V265, N3-5 (FEB
7), P353-357 |
| Direct observations of the structure of a
main-chain thermotropic liquid-crystalline homopolyester by scanning
tunneling microscopy | Nakajima K (REPRINT) ; Ikehara T; Nishi T;
Dae HC | UNIV TOKYO,SCH ENGN, DEPT APPL PHYS/TOKYO 11 3//JAPAN/
(REPRINT); UNIV AKRON,DEPT POLYMER ENGN/AKRON//OH/44325 | JAPANESE
JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW
PAPERS, 1996, V35, N12A (DEC), P6166-6171 |
| Near-field
optical microscopy in the infrared range | Piednoir A (REPRINT) ;
Creuzet F | LAB ST GOBAIN,CNRS, BP 135, 39 QUAI LUCIEN
LEFRANC/F-93303 AUBERVILLIERS//FRANCE/ (REPRINT) | MICRON, 1996,
V27, N5 (OCT), P335-339 |
| NANOSCALE CHARACTERIZATION OF
SEMICONDUCTOR-MATERIALS AND DEVICES USING SCANNING PROBE TECHNIQUES
| YU ET | UNIV CALIF SAN DIEGO,DEPT ELECT & COMP ENGN/LA
JOLLA//CA/92093 | MATERIALS SCIENCE & ENGINEERING R-REPORTS, 1996,
V17, N4-5 (NOV 15 ), P147-206 |
| SOME INVESTIGATIONS ON
HF-CVD DIAMOND USING SCANNING-TUNNELING-MICROSCOPY | SUMANT AV;
DHARMADHIKARI CV; GODBOLE VP | UNIV PUNE,DEPT PHYS/PUNE
411007/MAHARASHTRA/INDIA/; UNIV PUNE,DEPT PHYS/PUNE
411007/MAHARASHTRA/INDIA/ | MATERIALS SCIENCE AND ENGINEERING
B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1996, V41, N2 (NOV),
P267-272 |
| A NEW METHOD FOR STUDYING SEMICONDUCTING
SURFACES IN AIR BY SCANNING-TUNNELING-MICROSCOPY | FERLAUTO AS;
QUIVY AA | UNIV SAO PAULO,INST FIS,LAB NOVOS MAT SEMICOND,CP
66318/BR-05389970 SAO PAULO//BRAZIL/ | MODERN PHYSICS LETTERS B,
1996, V10, N24 (OCT 20), P1189-1195 |
| MORPHOLOGY AND
LOCAL ELECTRONIC-STRUCTURE OF METAL PARTICLES ON METAL-OXIDE SURFACES - A
SCANNING TUNNELING MICROSCOPIC AND SCANNING TUNNELING SPECTROSCOPIC STUDY
| XU C; GOODMAN DW | TEXAS A&M UNIV,DEPT CHEM/COLLEGE
STN//TX/77843 | CHEMICAL PHYSICS LETTERS, 1996, V263, N1-2 (DEC 6),
P13-18 |
| COMPARATIVE-STUDIES OF BACTERIAL BIOFILMS ON
STEEL SURFACES USING ATOMIC-FORCE MICROSCOPY AND ENVIRONMENTAL SCANNING
ELECTRON-MICROSCOPY | BEECH IB; CHEUNG CWS; JOHNSON DB; SMITH JR
| UNIV PORTSMOUTH,SCH CHEM PHYS & RADIOG/PORTSMOUTH PO1
2DT/HANTS/ENGLAND/; UNIV COLL N WALES,SCH BIOL SCI/BANGOR LL57
2UW/GWYNEDD/WALES/; UNIV PORTSMOUTH,FAC SCI,SCANNING PROBE MICROSCOPY
LAB/PORTSMOUTH PO1 2DT/HANTS/ENGLAND/ | BIOFOULING, 1996, V10,
N1-3, P65& |
| THE NANOWORLD - CHANCES AND CHALLENGES
| ROHRER H | IBM CORP,DIV RES,ZURICH RES LAB,SAUMERSTR
4/CH-8803 RUSCHLIKON//SWITZERLAND/ | MICROELECTRONIC ENGINEERING,
1996, V32, N1-4 (SEP), P5-14 |
| COLLECTIVE COMPUTATIONAL
ACTIVITY IN SELF-ASSEMBLED ARRAYS OF QUANTUM DOTS - A NOVEL NEUROMORPHIC
ARCHITECTURE FOR NANOELECTRONICS | ROYCHOWDHURY VP; JANES DB;
BANDYOPADHYAY S; WANG XD | PURDUE UNIV,SCH ELECT & COMP ENGN/W
LAFAYETTE//IN/47907; UNIV NOTRE DAME,DEPT ELECT ENGN/NOTRE
DAME//IN/46556; PURDUE UNIV,SCH ELECT & COMP ENGN/W LAFAYETTE//IN/47907
| IEEE TRANSACTIONS ON ELECTRON DEVICES, 1996, V43, N10 (OCT), P
1688-1699 |
| FORMATION AND MODIFICATION OF MESOSCOPIC
STRUCTURES ON GRAPHITE (HOPG) AND SILICON SURFACES BY MEANS OF
SCANNING-TUNNELING-MICROSCOPY | CZAJKA R; KASUYA A; WAWRO A;
HORIGUCHI N; NISHINA Y | TOHOKU UNIV,INST MAT RES/SENDAI/MIYAGI 9
80/JAPAN/; POZNAN TECH UNIV,INST PHYS/PL-60965 POZNAN//POLAND/; POLISH
ACAD SCI,INST PHYS/WARSAW//POLAND/ | SURFACE REVIEW AND LETTERS,
1996, V3, N1 (FEB), P961-967 |
| STRUCTURE IMAGING BY
ATOMIC-FORCE MICROSCOPY AND TRANSMISSION ELECTRON-MICROSCOPY OF DIFFERENT
LIGHT-EMITTING SPECIES OF POROUS SILICON | SASSAKI RM; DOUGLAS RA;
KLEINKE MU; TESCHKE O | UNIV ESTADUAL CAMPINAS,INST
QUIM/BR-13083970 CAMPINAS/SP/BRAZIL/; UNIV ESTADUAL CAMPINAS,DEPT FIS
APLICADA,INST FIS GLEB WATAGHIN/BR-13083970 CAMPINAS/SP/BRAZIL/
| JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, V14, N4 (JUL-AUG)
, P2432-2437 |
| SCANNING-TUNNELING-MICROSCOPY
OBSERVATIONS OF MERCURY DROPLETS ON GRAPHITE | OUSEPH PJ;
POOTHACKANAL T | UNIV LOUISVILLE,DEPT PHYS/LOUISVILLE//KY/40294
| LANGMUIR, 1996, V12, N16 (AUG 7), P3920-3926 |
|
SCANNED PROBE MICROSCOPIES IN CHEMISTRY | HAMERS RJ | UNIV
WISCONSIN,DEPT CHEM,1101 UNIV AVE/MADISON//WI/53706 | JOURNAL OF
PHYSICAL CHEMISTRY, 1996, V100, N31 (AUG 1), P 13103-13120 |
| DIRECT OBSERVATION OF A VACUUM TUNNEL GAP IN A TUNNELING
MICROSCOPE USING A TRANSMISSION ELECTRON-MICROSCOPE | LUTWYCHE MI;
WADA Y | HITACHI LTD,ADV RES LAB/HATOYAMA/SAITAMA 35003/JAPAN/
| JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1995, V13, N6 (NOV-DEC)
, P2819-2822 |
| ATOMIC-FORCE MICROSCOPY OF POLYMER-FILMS
| GOH MC | UNIV TORONTO,DEPT CHEM,80 ST GEORGE
ST/TORONTO/ON M5S 1A1/CANADA/ | ADVANCES IN CHEMICAL PHYSICS, 1995,
V91, P1-83 |
| SCANNING TUNNELING MICROSCOPE IMAGES OF
GRAPHITE SUBSTRATES USED IN GRAPHITE-FURNACE ATOMIC-ABSORPTION
SPECTROMETRY | VANDERVOORT KG; BUTCHER DJ; BRITTAIN CT; LEWIS BB
| WESTERN CAROLINA UNIV,DEPT CHEM &
PHYS/CULLOWHEE//NC/28723 | APPLIED SPECTROSCOPY, 1996, V50, N7
(JUL), P928-938 |
| THE CALCULATION OF STM IMAGES, STS
SPECTRA, AND XPS PEAK SHIFTS FOR GALENA - NEW TOOLS FOR UNDERSTANDING
MINERAL SURFACE-CHEMISTRY | BECKER U; HOCHELLA MF | UNIV
MANCHESTER,DEPT EARTH SCI,OXFORD RD/MANCHESTER M13 9PL/LANCS/ENGLAND/;
VIRGINIA POLYTECH INST & STATE UNIV,DEPT GEOL SCI/BLACKSBURG//VA/24061
| GEOCHIMICA ET COSMOCHIMICA ACTA, 1996, V60, N13 (JUL), P2413-2426
|
| SCANNING NEAR-FIELD OPTICAL MICROSCOPY OF FLUORESCENT
POLYSTYRENE SPHERES WITH A COMBINED SNOM AND AFM | FUJIHIRA M;
MONOBE H; YAMAMOTO N; MURAMATSU H; CHIBA N; NAKAJIMA K; ATAKA T
| TOKYO INST TECHNOL,DEPT BIOMOLEC ENGN,MIDORI KU,4259
NAGATSUTA/YOKOHAMA/KANAGAWA 226/JAPAN/; SEIKO INSTRUMENTS INC,RES LAB ADV
TECHNOL/MATSUDO/CHIBA 271/JAPAN/ | ULTRAMICROSCOPY, 1995, V61, N1-4
(DEC), P271-277 |
| SCANNING-TUNNELING-MICROSCOPY OF
SEMICONDUCTOR SURFACES | NEDDERMEYER H | UNIV HALLE
WITTENBERG,FACHBEREICH PHYS/D-06099 HALLE//GERMANY/ | REPORTS ON
PROGRESS IN PHYSICS, 1996, V59, N6 (JUN), P701-769 |
|
DIRECT OBSERVATION OF POLY(MACROMONOMER) BY SCANNING-TUNNELING-MICROSCOPY
| UNAYAMA SI; NAKAJIMA K; IKEHARA T; NISHI T; TSUKAHARA Y
| UNIV TOKYO,DEPT APPL PHYS,SCH ENGN/TOKYO 113//JAPAN/; KYOTO INST
TECHNOL,DEPT MAT SCI/KYOTO 606 //JAPAN/ | JAPANESE JOURNAL OF
APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1996,
V35, N4A (APR), P2280-2283 |
| NANOSTEP MOVEMENT AND
MEASUREMENT | TIPISSEV SY; GOLUBOK AO | RUSSIAN ACAD
SCI,INST ANALYT INSTRUMENTAT,RIZSKII PR 26/ST PETERSBURG 198103//RUSSIA/
| TRIBOLOGY INTERNATIONAL, 1996, V29, N5 (AUG), P373-376 |
| INVESTIGATION OF ASCORBATE-CU(II) INDUCED CLEAVAGE OF DNA BY
SCANNING-TUNNELING-MICROSCOPY | ZAREIE MH; ERDEM G; ONER C; ONER
R; OGUS A; PISKIN E | HACETTEPE UNIV,DEPT CHEM ENGN/ANKARA
06532//TURKEY/; HACETTEPE UNIV,DEPT CHEM ENGN/ANKARA 06532//TURKEY/;
HACETTEPE UNIV,BIOENGN DIV/ANKARA 06532//TURKEY/; HACETTEPE UNIV,DEPT
BIOL/ANKARA 06532//TURKEY/ | INTERNATIONAL JOURNAL OF BIOLOGICAL
MACROMOLECULES, 1996, V19, N1 (JUL), P69-73 |
| STUDY OF
THE ELECTRON MEAN FREE-PATH BY BALLISTIC-ELECTRON-EMISSION MICROSCOPY
| GIRARDIN C; CORATGER R; PECHOU R; AJUSTRON F; BEAUVILLAIN J
| CTR ELABORAT MAT & ETUD STRUCT,OPT ELECTR LABS,29 RUE JEANNE
MARVIG,BP 4347/F-31055 TOULOUSE//FRANCE/ | JOURNAL DE PHYSIQUE III,
1996, V6, N5 (MAY), P661-669 |
| STUDY OF THE PROXIMITY
EFFECT IN NB/AU, BI2SR2CACU2O8+Y/AU, AND HGBA2CUO4/AG USING A SCANNING
TUNNELING MICROSCOPE | ZASADZINSKI R; VANDERVOORT KG; CRABTREE GW
| ARGONNE NATL LAB,DIV MAT SCI,9700 S CASS AVE/ARGONNE//IL/60439;
IIT/CHICAGO//IL/60160 | JOURNAL OF APPLIED PHYSICS, 1996, V79, N10
(MAY 15), P7843-7848 |
| DATA EVALUATION TECHNIQUE FOR
ELECTRON-TUNNELING SPECTROSCOPY | UKRAINTSEV VA | UNIV
PITTSBURGH,CTR SURFACE SCI,DEPT CHEM/PITTSBURGH//PA/15260
| PHYSICAL REVIEW B-CONDENSED MATTER, 1996, V53, N16 (APR 15), P
11176-11185 |
| IN-SITU CONTROL AND ANALYSIS OF THE
SCANNING TUNNELING MICROSCOPE TIP BY FORMATION OF SHARP NEEDLES ON THE SI
SAMPLE AND W TIP | HEIKE S; HASHIZUME T; WADA Y | HITACHI
LTD,ADV RES LAB/HATOYAMA/SAITAMA 35003/JAPAN/ | JOURNAL
OF VACUUM SCIENCE & TECHNOLOGY B, 1996, V14, N2 (MAR-APR) , P1522-1526
|
| DIRECT PATTERNING OF SI(001) SURFACES BY ATOMIC
MANIPULATION | SALLING CT | UNIV ILLINOIS,BECKMAN INST,405
N MATHEWS AVE/URBANA//IL/61801; UNIV WISCONSIN/MADISON//WI/53706
| JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, V 14, N2
(MAR-APR) , P1322-1326 |
| ANALYSIS OF CEREAL CHROMOSOMES
BY ATOMIC-FORCE MICROSCOPY | MCMASTER TJ; WINFIELD MO; KARP A;
MILES MJ | UNIV BRISTOL,HH WILLS PHYS LAB/BRISTOL BS8
1TL/AVON/ENGLAND/; UNIV BRISTOL,LONG ASHTON RES STN,DEPT AGR SCI,INST
ARABLE CROPS RES/BRISTOL BS18 9AF/AVON/ENGLAND/ | GENOME, 1996,
V39, N2 (APR), P439-444 |
| HIGH-TEMPERATURE STM FOR
ATOMIC PROCESSES ON SEMICONDUCTOR SURFACES | IWATSUKI M; SATO T;
YAMAMOTO Y | JEOL LTD,MUSASHINO 3 CHOME/AKISHIMA/TOKYO 196/JAPAN/
| APPLIED SURFACE SCIENCE, 1996, V92, FEB (FEB), P321-330
|
| BIOLOGICAL ATOMIC-FORCE MICROSCOPY - WHAT IS ACHIEVED
AND WHAT IS NEEDED | SHAO ZF; MOU J; CZAJKOWSKY DM; YANG J; YUAN
JY | UNIV VIRGINIA,DEPT MOLEC PHYSIOL & BIOL PHYS,BOX
449/CHARLOTTESVILLE//VA/22908; UNIV VIRGINIA,BIOPHYS GRAD
PROGRAM/CHARLOTTESVILLE//VA/22908; UNIV VERMONT,DEPT
PHYS/BURLINGTON//VT/05405; ALBERTA RES COUNCIL/EDMONTON/AB T6H
5X2/CANADA | ADVANCES IN PHYSICS, 1996, V45, N1 (JAN-FEB), P1-86
|
| SCANNING TUNNELING SPECTROSCOPIC STUDY OF BARE AND
IODINE MODIFIED AU(111) AND PT(111) IN AQUEOUS-SOLUTION AND IN VACUUM
| NAGATANI Y; HAYASHI T; YAMADA T; ITAYA K | TOHOKU
UNIV,FAC ENGN,DEPT APPL CHEM,AOBA KU/SENDAI/MIYAGI 980/JAPAN/; TOHOKU
UNIV,FAC ENGN,DEPT APPL CHEM,AOBA KU/SENDAI/MIYAGI 980/JAPAN/;
ERATO,JRDC,ITAYA ELECTROCHEM PROJECT,TAIHAKU KU/SENDAI/MIYAGI 982/JAPAN/
| JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT
NOTES & REVIEW PAPERS, 1996, V35, N2A (FEB), P720-728 |
|
THE FIELD-INDUCED SURFACE POLYMERIZATION OF STYRENE | HUA ZY; XU
W; CAI L | FUDAN UNIV,DEPT MAT SCI/SHANGHAI 200433//PEOPLES R
CHINA/ | SURFACE SCIENCE, 1996, V349, N1 (MAR 20), PL111-L114
|
| SCANNING-TUNNELING-MICROSCOPY CHARACTERIZATION OF
ELECTRODE MATERIALS IN ELECTROCHEMISTRY | LI J; WANG EK
| ACAD SINICA,CHANGCHUN INST APPL CHEM,ELECTROANALYT CHEM
LAB/CHANGCHUN 130022//PEOPLES R CHINA/ | ELECTROANALYSIS, 1996, V8,
N2 (FEB), P107-112 |
| STUDY OF THE ELECTRONIC-STRUCTURE
OF GAAS(100) SINGLE-CRYSTAL ELECTRODE-ELECTROLYTE INTERFACES BY
ELECTROCHEMICAL TUNNELING SPECTROSCOPY | UOSAKI K; YE S; SEKINE N
| HOKKAIDO UNIV,GRAD SCH SCI,PHYS CHEM LAB/SAPPORO/HOKKAIDO 060/
JAPAN/ | BULLETIN OF THE CHEMICAL SOCIETY OF JAPAN, 1996, V69, N2
(FEB), P 275-288 |
| BIOLOGICAL ATOMIC-FORCE MICROSCOPY -
FROM MICRONS TO NANOMETERS AND BEYOND | SHAO ZF; YANG J; SOMLYO AP
| UNIV VIRGINIA,DEPT MOLEC PHYSIOL & BIOL PHYS,BOX
449/CHARLOTTESVILLE//VA/22908; UNIV VIRGINIA,BIOPHYS
PROGRAM/CHARLOTTESVILLE//VA/22908 | ANNUAL REVIEW OF CELL AND
DEVELOPMENTAL BIOLOGY, 1995, V11, P 241-265 |
|
PREPARATION OF SHARP POLYCRYSTALLINE TUNGSTEN TIPS FOR
SCANNING-TUNNELING-MICROSCOPY IMAGING | ZHANG R; IVEY DG
| UNIV ALBERTA,DEPT MIN MET & PETR ENGN/EDMONTON/AB T6G 2G6/CANADA/
| JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, V14, N1 (JAN-FEB)
, P1-10 |
| APPARENT BARRIER HEIGHT IN
SCANNING-TUNNELING-MICROSCOPY REVISITED | OLESEN L; BRANDBYGE M;
SORENSEN MR; JACOBSEN KW; LAEGSGAARD E; STENSGAARD I; BESENBACHER F
| AARHUS UNIV,INST PHYS & ASTRON,CTR ATOM SCALE MAT PHYS/DK-8000
AARHUS C//DENMARK/; TECH UNIV DENMARK,DEPT PHYS,CTR ATOM SCALE MAT
PHYS/DK-2800 LYNGBY//DENMARK/ | PHYSICAL REVIEW LETTERS, 1996, V76,
N9 (FEB 26), P1485-1488 |
| CORRECTION OF DISTORTED STM
IMAGE BY USING A REGULAR CRYSTALLINE LATTICE AND 2D FFT |
AKETAGAWA M; TAKADA K | NAGAOKA UNIV TECHNOL,DEPT MECH ENGN,1603-1
KAMITOMIOKA/NAGAOKA/NIIGATA 94021/JAPAN/ | NANOTECHNOLOGY, 1995,
V6, N4 (OCT), P105-110 |
| VERSATILE 3-DIMENSIONAL
CRYOGENIC MICROPOSITIONING DEVICE | HEIL J; BOHM A; PRIMKE M;
WYDER P | MAX PLANCK INST FESTKORPERFORSCH,HOCHFELD MAGNETLAB,BP
166,25 AVE MARTYRS/F-38042 GRENOBLE 9//FRANCE/; CNRS/F-38042 GRENOBLE
9//FRANCE/ | REVIEW OF SCIENTIFIC INSTRUMENTS, 1996, V67, N1 (JAN),
P307-311 |
| MANIPULATIONS WITH ATOMS AND CLUSTERS
| CZAJKA R | POZNAN UNIV TECHNOL,INST PHYS,PIOTROWO
3/PL-60965 POZNAN//POLAND/ | ACTA PHYSICA POLONICA A, 1995, V88, N5
(NOV), P813-828 |
| ADSORPTION OF GASES ON SOLID-SURFACES
| FREUND HJ | RUHR UNIV BOCHUM,LEHRSTUHL PHYS CHEM
1/D-44780 BOCHUM//GERMANY/ | BERICHTE DER
BUNSEN-GESELLSCHAFT-PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 1995, V99, N11
(NOV), P1261-1281 |
| APPLICATIONS OF WORK FUNCTION
MICROSCOPY IN THE ONSET MODE | SCHOLTES J | HSCH ABT
SOEST,INST TECHNOL & WISSENSTRANSFER,STEINGRABEN 21/D-59494
SOEST//GERMANY/ | FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 1995,
V353, N5-8 (NOV-DEC), P499-505 |
| COMPACT, PIEZO-DRIVEN,
VACUUM COMPATIBLE ROTATION DEVICE | VANDERWULP H; DEWITH E;
PISTECKY PV; SPRONCK JW | DELFT UNIV TECHNOL,DEPT MECH ENGN &
MARINE TECHNOL,MICRO ENGN LAB,MEKELWEG 2/2628 CD DELFT//NETHERLANDS/
| REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, V66, N11 (NOV),
P5339-5342 |
| MANUFACTURE OF MICROMECHANICAL SCANNING
TUNNELING MICROSCOPES FOR OBSERVATION OF THE TIP APEX IN A TRANSMISSION
ELECTRON-MICROSCOPE | LUTWYCHE MI; WADA Y | HITACHI LTD,ADV
RES LAB/HATOYAMA/SAITAMA 35003/JAPAN/ | SENSORS AND
ACTUATORS A-PHYSICAL, 1995, V48, N2 (MAY 15), P127-136 |
| A SIMPLE-MODEL FOR ORIENTATIONAL ORDERING OF A SILVER MONOLAYER
ELECTRODEPOSITED ON A C(0001) SURFACE | MOLA EE; APPIGNANESSI AG;
VICENTE JL; VAZQUEZ L; SALVAREZZA RC; ARVIA AJ | NATL UNIV LA
PLATA,FAC CIENCIAS EXACTAS,INST INVEST FISICOQUIM TEOR &
APLICADAS,SUCURSAL 4/RA-1900 LA PLATA//ARGENTINA/; CSIC,INST CIENCIAS
MAT/E-28006 MADRID//SPAIN/ | SURFACE REVIEW AND LETTERS, 1995, V2,
N4 (AUG), P489-494 |
| HONEYCOMB AND OTHER ANOMALOUS
SURFACE PICTURES OF GRAPHITE | OUSEPH PJ; POOTHACKANAL T; MATHEW G
| UNIV LOUISVILLE,DEPT PHYS/LOUISVILLE//KY/40292; UNIV
KENTUCKY,DEPT PHYS/LEXINGTON//KY/40506 | PHYSICS LETTERS A, 1995,
V205,
N1 (SEP 4), P65-71 |
| MICRO PATTERNING OF THIN ND-FE-B
FILMS | LEMKE H; LANG T; GODDENHENRICH T; HEIDEN C | UNIV
GIESSEN,INST ANGEW PHYS,HEINRICH BUFF RING16/D-35392 GIESSEN//GERMANY/
| JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 1995, V148, N3
(JUL) , P426-432 |
| SCANNING PROBE MICROSCOPY STUDIES OF
THE ACTIVATION AND DEACTIVATION OF PD THIN-FILM CATALYSTS | LEE
KH; WOLF EE | UNIV NOTRE DAME,DEPT CHEM ENGN/NOTRE DAME//IN/46556;
UNIV NOTRE DAME,DEPT CHEM ENGN/NOTRE DAME//IN/46556 | STUDIES IN
SURFACE SCIENCE AND CATALYSIS, 1994, V88, P69-84 |
|
SCANNING PROBE MICROSCOPY STUDIES OF THE ACTIVATION AND DEACTIVATION OF PD
THIN-FILM CATALYSTS | LEE KH; WOLF EE | UNIV NOTRE
DAME,DEPT CHEM ENGN/NOTRE DAME//IN/46556; UNIV NOTRE DAME,DEPT CHEM
ENGN/NOTRE DAME//IN/46556 | STUDIES IN SURFACE SCIENCE AND
CATALYSIS, 1994, V88, P69-84 |
| THERMAL CONTRACTION OF
ULTRAHIGH-VACUUM MATERIALS FOR SCANNING PROBE MICROSCOPY FROM 300 TO 4 K
| NUNES G; WILLIAMS D | DARTMOUTH COLL,DEPT PHYS &
ASTRON,6127 WILDER LAB/HANOVER//NH/03755 | JOURNAL OF VACUUM
SCIENCE & TECHNOLOGY B, 1995, V13, N3 (MAY-JUN) , P1063-1065 |
| INFLUENCE OF A TIP SAMPLE INTERACTION ON SCANNING TUNNELING
SPECTROSCOPY DATA | ZAVODINSKY VG; KUYANOV IA | RUSSIAN
ACAD SCI,FAR EASTERN DIV,INST AUTOMAT &CONTROL PROC,5 RADIO
STR/VLADIVOSTOK 690041//RUSSIA/; FAR EASTERN STATE UNIV,INST RES PHYS &
TECH/VLADIVOSTOK 690600//RUSSIA/ | SURFACE REVIEW AND LETTERS,
1995, V2, N2 (APR), P219-223 |
| EXPERIMENTAL-OBSERVATIONS
OF SELF-AFFINE SCALING AND KINETIC ROUGHENING AT SUBMICRON LENGTHSCALES
| KRIM J; PALASANTZAS G | NORTHEASTERN UNIV,DEPT
PHYS/BOSTON//MA/02115 | INTERNATIONAL JOURNAL OF MODERN PHYSICS B,
1995, V9,
N6 (MAR 15) , P599-632 |
| ANALYSIS OF
SCANNING-TUNNELING-MICROSCOPY FEEDBACK-SYSTEM | OLIVA AI; ANGUIANO
E; DENISENKO N; AGUILAR M; PENA JL | CSIC,INST CIENCIA MAT,CAMPUS
UNIV AUTONOMA MADRID,C-III/E-28049 MADRID//SPAIN/; CSIC,INST CIENCIA
MAT/E-28049 MADRID//SPAIN/; IPN,CTR INVEST & ESTUDIOS AVANZADOS,UNIDAD
MERIDA/MERIDA 97310/YUCATAN/MEXICO/ | REVIEW OF SCIENTIFIC
INSTRUMENTS, 1995, V66, N5 (MAY), P3196-3203 |
|
SCANNING-TUNNELING-MICROSCOPY .1. THEORETICAL FRAMEWORK AND COHERENCE
EFFECTS | KENKRE VM; BISCARINI F; BUSTAMANTE C | UNIV NEW
MEXICO,DEPT PHYS & ASTRON/ALBUQUERQUE//NM/87131; UNIV OREGON,DEPT
CHEM/EUGENE//OR/97403; UNIV OREGON, INST MOLEC BIOL/EUGENE//OR/97403
| PHYSICAL REVIEW B-CONDENSED MATTER, 1995, V51, N16 (APR 15), P
11074-11088 |
| MAGNETIC-RESONANCE FORCE MICROSCOPY
| SIDLES JA; GARBINI JL; BRULAND KJ; RUGAR D; ZUGER O; HOEN S;
YANNONI CS | UNIV WASHINGTON,SCH MED,DEPT
ORTHOPAED/SEATTLE//WA/98195; UNIV WASHINGTON,DEPT MECH
ENGN/SEATTLE//WA/98195; IBM CORP, DIV RES,ALMADEN RES CTR/SAN
JOSE//CA/95120 | REVIEWS OF MODERN PHYSICS, 1995, V67, N1 (JAN),
P249-265 |
| NANOWRITING ON AN ATOMICALLY FLAT GOLD
SURFACE WITH SCANNING TUNNELING MICROSCOPE | LEBRETON C; WANG ZZ
| CNRS,MICROSTRUCT & MICROELECTR LAB,196 AVE H RAVERA/F-92225
BAGNEUX//FRANCE/; CNRS,MICROSTRUCT & MICROELECTR LAB/F-92225
BAGNEUX//FRANCE/ | SCANNING MICROSCOPY, 1994, V8, N3, P441-448
|
| A FASCINATING NEW FIELD IN COLLOID SCIENCE - SMALL
LIGAND STABILIZED METAL-CLUSTERS AND THEIR POSSIBLE APPLICATION IN
MICROELECTRONICS .2. FUTURE-DIRECTIONS | SCHON G; SIMON U
| UNIV ESSEN GESAMTHSCH,INST ANORGAN CHEM,SCHUTZENBAHN 70/D-45127
ESSEN//GERMANY/ | COLLOID AND POLYMER SCIENCE, 1995, V273, N3
(MAR), P202-218 |
| DOUBLE-TIP SCANNING TUNNELING
MICROSCOPE FOR SURFACE-ANALYSIS | NIU Q; CHANG MC; SHIH CK
| UNIV TEXAS,DEPT PHYS/AUSTIN//TX/78712 | PHYSICAL REVIEW
B-CONDENSED MATTER, 1995, V51, N8 (FEB 15), P 5502-5505 |
| MANIPULATION OF MATTER AT THE ATOMIC AND MOLECULAR-LEVELS
| AVOURIS P | IBM CORP,DIV RES,TJ WATSON RES CTR,CHEM PHYS
SURFACES GRP/YORKTOWN HTS//NY/10598 | ACCOUNTS OF CHEMICAL
RESEARCH, 1995, V28, N3 (MAR), P95-102 |
| LOCAL PROBE
INVESTIGATION OF MOLECULAR MATERIAL | MICHEL B | IBM
CORP,DIV RES,ZURICH RES LAB/CH-8803 RUSCHLIKON//SWITZERLAND/
| BIOSENSORS & BIOELECTRONICS, 1995, V10, N1-2, P85-98 |
| STM STUDY OF MO GROWTH AND INDUCED SURFACE-STRUCTURE CHANGES ON
HOPG | XU H; PERMANA H; LU Y; NG KYS | WAYNE STATE
UNIV,DEPT CHEM ENGN/DETROIT//MI/48202; WAYNE STATE UNIV,DEPT CHEM
ENGN/DETROIT//MI/48202 | SURFACE SCIENCE,
1995, V325, N3 (MAR 1), P285-293 |
| AU/N-ZNSE CONTACTS
STUDIED WITH USE OF BALLISTIC-ELECTRON-EMISSION MICROSCOPY |
CORATGER R; AJUSTRON F; BEAUVILLAIN J; DHARMADASA IM; BLOMFIELD CJ; PRIOR
KA; SIMPSON J; CAVENETT BC | CNRS,CTR ELABORAT MAT & ETUD
STRUCT,OPT ELECTR
LAB,29 RUE J MARVIG,BOITE POSTALE 4347/F-31055 TOULOUSE//FRANCE/;
SHEFFIELD HALLAM UNIV,MAT RES INST/SHEFFIELD S11WB/S YORKSHIRE/ENGLAND/;
HERIOT WATT UNIV,DEPT PHYS/EDINBURGH EH14 4AS/MI | PHYSICAL REVIEW
B-CONDENSED MATTER, 1995, V51, N4 (JAN 15), P 2357-2362 |
| LOW-TEMPERATURE SCANNING-TUNNELING-MICROSCOPY AND SPECTROSCOPY OF
SINGLE-CRYSTALS OF THE HIGH-TEMPERATURE SUPERCONDUCTOR BI2SR2CACU2O8,
CLEAVED IN-SITU AND AT ROOM-TEMPERATURE | HANCOTTE H; DAVYDOV DN;
YE M; DELTOUR R | FREE UNIV BRUSSELS/B-1050 BRUSSELS//BELGIUM/
| PHYSICA B, 1995, V204, N1-4 (JAN), P206-213 |
|
STUDY OF BI2SR2CACU2O8+D SINGLE-CRYSTALS CLEAVED AT LOW-TEMPERATURE BY
SCANNING-TUNNELING-MICROSCOPY AND SPECTROSCOPY | HANCOTTE H;
DAVYDOV DN; YE M; DELTOUR R | FREE UNIV BRUSSELS,CP 233,BD
TRIOMPHE/B-1050 BRUSSELS//BELGIUM/ | PHYSICA C, 1994, V235, DEC
(DEC), P1883-1884 |
| HIGH-DENSITY THERMOMAGNETIC
RECORDING METHOD USING A SCANNING TUNNELING MICROSCOPE | NAKAMURA
J; MIYAMOTO M; HOSAKA S; KOYANAGI H | HITACHI LTD,ADV RES LAB,CENT
RES LAB,1-280 HIGASHI KOIGAKUBO/KOKUBUNJI/TOKYO 185/JAPAN/ |
JOURNAL OF APPLIED PHYSICS, 1995, V77, N2 (JAN 15), P779-781 |
| VISUALIZATION OF SURFACTANTS ON NANOSTRUCTURED PALLADIUM CLUSTERS
BY A COMBINATION OF STM AND HIGH-RESOLUTION TEM | REETZ MT; HELBIG
W; QUAISER SA; STIMMING U; BREUER N; VOGEL R | MAX PLANCK INST
KOHLENFORSCH,KAISER WILHELM PL 1/D-45470 MULHEIM//GERMANY/; KFA JULICH
GMBH,FORSCHUNGSZENTRUM,INST ENERGIEVERFAHRENSTECHN/D-52424
JULICH//GERMANY/ | SCIENCE, 1995, V267, N5196 (JAN 20), P367-369
|
| APPROACHING MICROTUBULE STRUCTURE WITH THE SCANNING
TUNNELING MICROSCOPE (STM) | MAALOUM M; CHRETIEN D; KARSENTI E;
HORBER JKH | EUROPEAN MOLEC BIOL LAB,MEYERHOFSTR 1/D-69112
HEIDELBERG//GERMANY/; EUROPEAN MOLEC BIOL LAB/D-69112
HEIDELBERG//GERMANY/ | JOURNAL OF CELL SCIENCE, 1994, V107, NOV
(NOV), P3127-3131 |
| BIAS-DEPENDENT STM IMAGES OF
CHARGE-DENSITY WAVES ON TAS2 | HAN WH; HUNT ER; PANKRATOV O;
FRINDT RF | UNIV VIRGINIA,DEPT MOLEC PHYSIOL & BIOL
PHYS/CHARLOTTESVILLE//VA/22908; OHIO UNIV,DEPT PHYS & ASTRON,CONDENSED
MATTER &SURFACE SCI PROGRAM/ATHENS//OH/45701; MAX PLANCK GESELL,FRITZ
HABER INST,DEPT THEORY/D-14195 BERLIN//GERMANY/; SIMO | PHYSICAL
REVIEW B-CONDENSED MATTER, 1994, V50, N19 (NOV 15), P 14746-14749
|
| LOW-ENERGY ELECTRONS (LEED, STM AND HREELS) IN THE
MICROANALYTICAL CHARACTERIZATION OF COMPLEX SURFACE-STRUCTURES |
WEISS W; STARKE U; SOMORJAI GA | UNIV CALIF BERKELEY,LAWRENCE
BERKELEY LAB,DIV MAT SCI/BERKELEY//CA/94720; UNIV CALIF BERKELEY,LAWRENCE
BERKELEY LAB,DIV MAT SCI/BERKELEY//CA/94720; UNIV CALIF BERKELEY,LAWRENCE
BERKELEY LAB,DEPT CHEM/BERKELEY//CA/94720 | ANALYTICA CHIMICA ACTA,
1994, V297, N1-2 (OCT 31), P109-124 |
|
SCANNING-TUNNELING-MICROSCOPY AND RELATED TECHNIQUES FOR SURFACE-ANALYSIS
| CORATGER R; SIVEL V; AJUSTRON F; BEAUVILLAIN J
| CNRS,CEMES LOE,RUE J MARVIG BP 4347/F-31055 TOULOUSE//FRANCE/
| MICRON, 1994, V25, N4, P371-385 |
|
SUPERCOMPUTING WITH SPIN-POLARIZED SINGLE ELECTRONS IN A QUANTUM COUPLED
ARCHITECTURE | BANDYOPADHYAY S; DAS B; MILLER AE | UNIV
NOTRE DAME,DEPT ELECT ENGN/NOTRE DAME//IN/46556 | NANOTECHNOLOGY,
1994, V5, N2 (APR), P113-133 |
| ELECTRON CONDUCTION IN
MOLECULAR WIRES .1. A SCATTERING FORMALISM | MUJICA V; KEMP M;
RATNER MA | NORTHWESTERN UNIV,DEPT CHEM,2145 SHERIDAN
RD/EVANSTON//IL/60208 | JOURNAL OF CHEMICAL PHYSICS, 1994, V101, N8
(OCT 15), P6849-6855 |
| IMPEDANCE SPECTROSCOPY AND
SCANNING-TUNNELING-MICROSCOPY OF POLISHED AND ELECTROCHEMICALLY PRETREATED
GLASSY-CARBON | HEIDUSCHKA P; MUNZ AW; GOPEL W | UNIV
TUBINGEN,INST PHYS & THEORET CHEMD,AUF MORGENSTELLE 8/D-72076
TUBINGEN//GERMANY/ | ELECTROCHIMICA ACTA, 1994, V39, N14 (OCT),
P2207-2223 |
| MORE INFORMATION ON THE CALIBRATION OF
SCANNING STYLUS MICROSCOPES BY 2-DIMENSIONAL FAST FOURIER-TRANSFORM
ANALYSIS | CARRARA S; FACCI P; NICOLINI C | UNIV GENOA,INST
BIOPHYS,VIA GIOTTO 2/I-16153 GENOA//ITALY/ | REVIEW OF SCIENTIFIC
INSTRUMENTS, 1994, V65, N9 (SEP), P2860-2863 |
| A NOVEL
AFM/STM/SEM SYSTEM | ERMAKOV AV; GARFUNKEL EL | RUTGERS
STATE UNIV,DEPT CHEM,POB 939/PISCATAWAY//NJ/08855 ; RUTGERS STATE
UNIV,SURFACE MODIFICAT LAB/PISCATAWAY//NJ/00000; ST PETERSBURG STATE
UNIV,INST PHYS/PETRODVORETS190000//RUSSIA/ | REVIEW OF SCIENTIFIC
INSTRUMENTS, 1994, V65, N9 (SEP), P2853-2854 |
| SCANNING
TUNNELING INDUCED LUMINESCENCE IN SEMICONDUCTORS AND METAL-FILMS |
BISCHOFF M; KREBS B; PAGNIA H; STEHLE M | TECH HSCH,INST ANGEW
PHYS,SCHLOSSGARTENSTR 7/D-64289 DARMSTADT//GERMANY/ | INTERNATIONAL
JOURNAL OF ELECTRONICS, 1994, V77, N2 (AUG), P 205-212 |
|
CONTROL OF PHOTON-EMISSION BY SCANNING-TUNNELING-MICROSCOPY IN AIR
| SIVEL V; CORATGER R; AJUSTRON F; BEAUVILLAIN J | CTR
ELABORAT MAT & ETUD STRUCT OPT ELECTR LAB,29 RUE J MARVIG,BOITE POSTALE
4347/F-31055 TOULOUSE//FRANCE/ | PHYSICAL REVIEW B-CONDENSED
MATTER, 1994, V50, N8 (AUG 15), P 5628-5634 |
|
CHARACTERIZATION OF THE METAL-SEMICONDUCTOR INTERFACE BY
BALLISTIC-ELECTRON-EMISSION MICROSCOPY | CORATGER R; AJUSTRON F;
BEAUVILLAIN J | CEMES,LOE,CNRS,29 RUE J MARVIG,BP 4347/F-31055
TOULOUSE//FRANCE/ | MICROSCOPY MICROANALYSIS MICROSTRUCTURES, 1994,
V5, N1 (FEB), P 31-40 |
| PROGRESS IN THE KNOWLEDGE OF
IRREGULAR SOLID ELECTRODE SURFACES | ARVIA AJ; SALVAREZZA RC
| INST INVEST FISICOQUIM TEROR & APLICADAS,CASILLA CORREO
16,SUCURSAL 4/RA-1900 LA PLATA//ARGENTINA/ | ELECTROCHIMICA ACTA,
1994, V39, N11-1 (AUG), P1481-1494 |
| IN-SITU
SCANNING-TUNNELING-MICROSCOPY OF 3-POINT BENDING INVESTIGATIONS |
FRIES T; OSTER K; WANDELT K | GUNTHER SYST TECH,GODESBERGER STR
8/D-53639 KONIGSWINTER//GERMANY/; UNI BONN,INST PHYS/D-53115
BONN//GERMANY/ | ACTA METALLURGICA ET MATERIALIA, 1994, V42, N9
(SEP), P3129-3136 |
| SCANNING NEAR-FIELD FLUORESCENCE
MICROSCOPY AND NANOSCOPIC FLUORESCENCE SPECTROSCOPY IN COMBINATION WITH A
NONCONTACT SCANNING FORCE MICROSCOPE | FUJIHIRA M; MONOBE H;
MURAMATSU H; ATAKA T | TOKYO INST TECHNOL,DEPT BIOMOLEC ENGN,
MIDORI KU,4259 NAGATSUTA/YOKOHAMA 227//JAPAN/; SEIKO INSTRUMENTS INC,ADV
TECHNOL RES LAB/MATSUDO/CHIBA 271/JAPAN/ | CHEMISTRY LETTERS, 1994,
N3 (MAR), P657-660 |
| SCANNING-TUNNELING-MICROSCOPY
OBSERVATIONS OF THE EVOLUTION OF SMALL-SCALE TOPOGRAPHY ON GOLD SURFACES
FOLLOWING IRRADIATION WITH LOW-ENERGY ARGON IONS | VISHNYAKOV V;
DONNELLY SE; CARTER G | UNIV SALFORD,DEPT ELECTR & ELECT
ENGN,ELECTR MAT & DEV GRP/SALFORD M5 4WT/LANCS/ENGLAND/
| PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STRUCTURAL
ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1994, V70, N1 (JUL), P 151-157
|
| SCANNING PROBE MICROSCOPY ON SUPERCONDUCTORS -
ACHIEVEMENTS AND CHALLENGES | HARTMANN U | UNIV
SAARBRUCKEN,INST EXPTL PHYS,POB 1150/D-66041 SAARBRUCKEN//GERMANY/; KFA
JULICH GMBH,INST THIN FILM & ION TECHNOL/D-52425 JULICH//GERMANY/
| APPLIED PHYSICS A-SOLIDS AND SURFACES, 1994, V59, N1 (JUL),
P41-48 |
| TUNNELING MEASUREMENT OF THE QUASI-PARTICLE
LIFETIME IN BA1-XKXBIO3 | ZASADZINSKI R; VANDERVOORT KG; HINKS DG;
CRABTREE GW | ARGONNE NATL LAB,DIV MAT SCI/ARGONNE//IL/60439;
IIT/CHICAGO//IL/60160 | JOURNAL OF APPLIED PHYSICS, 1994, V76, N1
(JUL 1), P407-411 |
| INVESTIGATION OF
SCANNING-TUNNELING-MICROSCOPY TUNNELING BARRIER SIGNALS IN AIR AND WATER
| SONG JP; MORCH KA; CARNEIRO K; THOLEN AR | TECH UNIV
DENMARK,DEPT PHYS,BLDG 307/DK-2800 LYNGBY//DENMARK/; DANISH INST
FUNDAMENTAL METROL/ DK-2800 LYNGBY//DENMARK/; XIAN JIAOTONG UNIV,DEPT
ELECTR ENGN/XIAN 710049//PEOPLES R CHINA/ | JOURNAL OF VACUUM
SCIENCE & TECHNOLOGY B, 1994, V12, N3 (MAY-JUN) , P2237-2242 |
| STUDIES ON THE SCANNING-TUNNELING-MICROSCOPY IMAGES OF ADSORBATES
WITH THE METHOD OF EXCITON DYNAMICS AND THEIR APPLICATION | LI YP;
HUANG XT; ZHANG HF; HUANG WH | UNIV SCI & TECHNOL CHINA,DEPT
PHYS/HEFEI 230026//PEOPLES R CHINA/; UNIV SCI & TECHNOL CHINA,DEPT
PHYS/HEFEI 230026//PEOPLES R CHINA/; UNIV SCI & TECHNOL CHINA,STRUCT RES
LAB/HEFFEI 230026//PEOPLES R CHINA/; HUAZHONG NORMAL UNIV,DEPT
P | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, V12, N3
(MAY-JUN) , P2171-2174 |
| MANIPULATION OF RECTANGULAR
ARRANGEMENT OF SE-RING-TYPE MOLECULES ON GRAPHITE (HIGHLY ORIENTED
PYROLYTIC-GRAPHITE) SURFACES | CZAJKA R; KASUYA A; HORIGUCHI N;
NISHINA Y | TOHOKU UNIV,INST MAT RES,KATAHIRA 2-1-1/SENDAI/MIYAGI
980/
JAPAN/; POZNAN TECH UNIV,INST PHYS/PL-60965 POZNAN//POLAND/
| JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, V12, N3 (MAY-JUN)
, P1890-1893 |
| NANOMETER CHARACTERIZATION OF
SINGLE-POINT DIAMOND-TURNED MIRRORS ON THE MICROMETER AND SUBMICROMETER
SCALE | YU J; HOU L; MA WS; CAO JL; YU JY; YAO JE | ACAD
SINICA,CHANGCHUN INST OPT & FINE MECH,STATE KEY LAB APPL OPT/CHANGCHUN
130022//PEOPLES R CHINA/; ACAD SINICA,BEIJING LAB ELECTRON
MICROSCOPY/BEIJING 100080//PEOPLES R CHINA/; JILIN UNIV TECHNOL/CHANGCHUN
130025//PEOPLES R CHINA/ | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY
B, 1994, V12, N3 (MAY-JUN) , P1835-1838 |
| THE
INFORMATIVITY OF IMAGES IN THE PROBLEM OF INTERPRETATION OF MEASUREMENTS
USING A SCANNING TUNNEL MICROSCOPE | MANOLOV VP; PYTEV YP
| MOSCOW MV LOMONOSOV STATE UNIV,CHAIR COMP METHODS
PHYS/MOSCOW//RUSSIA/ | VESTNIK MOSKOVSKOGO UNIVERSITETA SERIYA 3
FIZIKA ASTRONOMIYA, 1993 , V34, N6 (NOV-DEC), P14-21 |
|
IN-SITU STRESS INVESTIGATIONS ON THIN COPPER-FILMS WITH THE STM |
FRIES T; OSTER K; WANDELT K | UNIV BONN,INST PHYS CHEM,WEGELERSTR
12/D-53155 BONN//GERMANY/ | ADVANCED MATERIALS, 1994, V6, N6 (JUN),
P473-476 |
| INVADING THE PRIVATE WORLD OF
SURFACE-REACTIONS | PASTEUR A | UNIV CAMBRIDGE,SURFACE SCI
GRP/CAMBRIDGE//ENGLAND/ | CHEMISTRY & INDUSTRY, 1994, N12 (JUN 20),
P466-467 |
| SIMPLE DESIGN OF SCANNING TUNNELING
MICROSCOPE FOR USE IN TOPOGRAPHY AND SPECTROSCOPY | CHUANG CS;
CHEN TT | NATL TSING HUA UNIV,DEPT PHYS/HSINCHU 300//TAIWAN/
| CHINESE JOURNAL OF PHYSICS, 1994, V32, N3 (JUN), P289-297
|
| STEP-STRUCTURE DEPENDENT STEP-FLOW - MODELS FOR THE
HOMOEPITAXIAL GROWTH AT THE ATOMIC STEPS ON SI(111)7X7 | SHIMADA
W; TOCHIHARA H | HOKKAIDO UNIV,CATALYSIS RES CTR/SAPPORO/HOKKAIDO
060/JAPAN/; HOKKAIDO UNIV,CATALYSIS RES CTR/SAPPORO/HOKKAIDO 060/JAPAN/ ;
HOKKAIDO UNIV,INST LOW TEMP SCI/SAPPORO/HOKKAIDO 060/JAPAN/
| SURFACE SCIENCE, 1994, V311, N1-2 (MAY 10), P107-125 |
| SCANNING-TUNNELING-MICROSCOPY STUDY OF TIP BIAS-INDUCED SURFACE
CHANGES ON PLATINUM | HOFFMANNMILLACK B; STEER WS | UNIV
LONDON IMPERIAL COLL SCI TECHNOL & MED,BLACKETT LAB/LONDON SW7
2BZ//ENGLAND/; UNIV LONDON IMPERIAL COLL SCI TECHNOL & MED,BLACKETT
LAB/LONDON SW7 2BZ//ENGLAND/ | SURFACE AND INTERFACE ANALYSIS,
1994, V21, N4 (APR), P251-256 |
| BIOLOGICAL APPLICATIONS
OF SCANNING PROBE MICROSCOPIES | MORRIS VJ | AFRC,FOOD RES
INST,NORWICH LAB,NORWICH RES PK/NORWICH NR4 7UA//ENGLAND/
| PROGRESS IN BIOPHYSICS & MOLECULAR BIOLOGY, 1994, V61, N2, P
131-185 |
| DETAILED EXPERIMENTAL INVESTIGATION OF THE BARRIER-HEIGHT
LOWERING AND THE TIP-SAMPLE FORCE GRADIENT DURING STM OPERATION IN AIR
| MEEPAGALA SC; REAL F | POLYTECH INST NEW YORK,DEPT
PHYS/BROOKLYN//NY/11201 | PHYSICAL REVIEW
B-CONDENSED MATTER, 1994, V49, N15 (APR 15), P 10761-10763 |
| CONTRIBUTIONS OF SCANNING PROBE MICROSCOPY AND SPECTROSCOPY TO
THE INVESTIGATION AND FABRICATION OF NANOMETER-SCALE STRUCTURES |
WIESENDANGER R | UNIV HAMBURG,INST APPL PHYS,JUNGIUSSTR 11/D-20355
HAMBURG//GERMANY/; UNIV HAMBURG,CTR MICROSTRUCT RES/D-20355
HAMBURG//GERMANY/ | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994,
V12, N2 (MAR-APR) , P515-529 |
| RECTANGULAR ARRANGEMENT
OF SE-RING CLUSTERS ON GRAPHITE SURFACE AND THEIR STRUCTURAL
TRANSFORMATION | CZAJKA R; GU BL; YU JZ; OHNO K; KAWAZOE Y; KASUYA
A; NISHINA Y | TOHOKU UNIV,INST MAT RES/SENDAI/MIYAGI 980/JAPAN/;
TSING HUA UNIV,DEPT PHYS/BEIJING 100084//PEOPLES R CHINA/ | SCIENCE
REPORTS OF THE RESEARCH INSTITUTES TOHOKU UNIVERSITY SERIES A-PHYSICS
CHEMISTRY AND METALLURGY, 1993, V39, N1 (DEC), P57-62 |
|
SPIN-POLARIZED SCANNING-TUNNELING-MICROSCOPY - THE SENSITIVITY OF THE
SPIN-DEPENDENT CURRENT ASYMMETRY TO THE BARRIER SHAPE | REITTU HJ
| UNIV TURKU,WIHURI PHYS LAB/SF-20500 TURKU 50//FINLAND/
| JOURNAL OF PHYSICS-CONDENSED
MATTER, 1994, V6, N10 (MAR 7), P 1847-1856 |
| SCANNING
TUNNELING MICROSCOPE WITH ATOMIC-RESOLUTION | OLIVA AI; REJON V;
SALAZAR NL; AVILA E; KANTUN T; CORONA JE; PENA JL | IPN,CTR INVEST
& ESTUDIOS AVANZADOS,UNIDAD MERIDA,APARTADO POSTAL 73/MERIDA
97310/YUCATAN/MEXICO/ | REVISTA MEXICANA DE FISICA, 1994, V40, N1
(JAN), P106-118 |
| SCANNING TUNNELING SPECTROSCOPY
| FEENSTRA RM | IBM CORP,DIV RES,THOMAS J WATSON RES
CTR/YORKTOWN HTS//NY/10598 | SURFACE SCIENCE, 1994, V300, N1-3 (JAN
1), P965-979 |
| SCANNING-TUNNELING-MICROSCOPY - A SURFACE
SCIENCE TOOL AND BEYOND | ROHRER H | IBM CORP,DIV
RES,ZURICH RES LAB/CH-8803 RUSCHLIKON//SWITZERLAND/ | SURFACE
SCIENCE, 1994, V300, N1-3 (JAN 1), P956-964 |
| AN STM
STUDY OF THE DEVELOPMENT OF SURFACE-FEATURES ON GOLD UNDER LOW-ENERGY
HELIUM ION-BOMBARDMENT | DONNELLY SE; VISHNYAKOV V; TAYLOR D;
VALIZADEH R; BALLARD IM; GODDARD DT | UNIV SALFORD,DEPT ELECTR &
ELECT ENGN,ELECTR MAT & DEVICES GRP/SALFORD M5 4WT/LANCS/ENGLAND/;
BRITISH NUCL FUELS PLC,CO RES LABS/PRESTON PR4 0XJ/LANCS/ENGLAND/
| APPLIED SURFACE SCIENCE, 1994, V74, N1 (JAN), P81-90 |
| SURFACE-STRUCTURE IMAGING, ELECTRONICALLY INDUCED MODIFICATIONS
AND ELECTROLUMINESCENCE OF POROUS SILICON BY SCANNING-TUNNELING-MICROSCOPY
| ENACHESCU M; HARTMANN E; KUX A; KOCH F | TECH UNIV
MUNICH,DEPT PHYS E16,JAMES FRANCK STR/ D-85747 GARCHING//GERMANY/; UNIV
BUCHAREST,DEPT PHYS/BUCHAREST//ROMANIA/ | JOURNAL OF LUMINESCENCE,
1993, V57, N1-6 (NOV-DEC), P191-196 |
|
BALLISTIC-ELECTRON-EMISSION MICROSCOPY OF THE AN-SI (100) INTERFACE
| CORATGER R; AJUSTRON F; BEAUVILLAIN J | CNRS,CEMES,LOE,29
RUE J MARVIG,BP 4347/F-31055 TOULOUSE//FRANCE/ | JOURNAL DE
PHYSIQUE III, 1993, V3, N12 (DEC), P2211-2220 |
|
CHARACTERIZATION OF ULTRAFINE AEROSOL-PARTICLES ADSORBED ON HIGHLY
ORIENTED PYROLYTIC-GRAPHITE BY SCANNING TUNNELING AND ATOMIC-FORCE
MICROSCOPY | SCHLEICHER B; JUNG T; BURTSCHER H | SWISS FED
INST TECHNOL,SOLID STATE PHYS LAB/CH-8093 ZURICH//SWITZERLAND/; SWISS FED
INST TECHNOL,SOLID STATE PHYS LAB/CH-8093 ZURICH//SWITZERLAND/; UNIV
BASEL,INST PHYS/CH-4056 BASEL//SWITZERLAND/ | JOURNAL OF COLLOID
AND INTERFACE SCIENCE, 1993, V161, N2 (DEC), P 271-277 |
|
AN STM STUDY OF COPPER SURFACES IRRADIATED WITH LOW-ENERGY HELIUM-IONS
| BROOKS WS; MEYER E; DONNELLY SE; VISHNYAKOV V; VALIZADEH R;
TEMPLIER C; BIRTCHER R | UNIV SALFORD,DEPT ELECTR & ELECT
ENGN/MANCHESTER M5 4WT/LANCS/ENGLAND/; UNIV POITIERS,MET PHYS
LAB/POITIERS//FRANCE/; ARGONNE NATL LAB,DIV MAT SCI/ARGONNE//IL/60439
| JOURNAL OF NUCLEAR MATERIALS, 1993, V206, N1 (NOV), P107-110
|
| PICOSECOND RESOLUTION IN SCANNING-TUNNELING-MICROSCOPY
| NUNES G; FREEMAN MR | IBM CORP,THOMAS J WATSON RES
CTR,POB 218/YORKTOWN HTS//NY/10598; DARTMOUTH COLL,DEPT PHYS &
ASTRON/HANOVER//NH/03755 | SCIENCE, 1993, V262, N513 6 (NOV 12),
P1029-1032 |
| STM INVESTIGATIONS OF SOLID-SURFACES IN
WATER AND AIR | SONG JP; MORCH KA; CARNEIRO K; THOLEN AR
| TECH UNIV DENMARK,DEPT PHYS,BLDG 307/DK-2800 LYNGBY//DENMARK/;
DANISH INST FUNDAMENTAL METROL/DK-2800 LYNGBY//DENMARK/; XIAN JIAOTONG
UNIV,DEPT ELECTR ENGN/XIAN//PEOPLES R CHINA/ | SURFACE SCIENCE,
1993, V296, N3 (NOV 1), P299-309 |
| PROMISES AND PROBLEMS
OF BIOLOGICAL ATOMIC-FORCE MICROSCOPY | YANG J; TAMM LK; SOMLYO
AP; SHAO Z | UNIV VIRGINIA,SCH MED,BIO SPM LAB,BOX
449/CHARLOTTESVILLE//VA/22908; UNIV VIRGINIA,SCH MED,BIO SPM LAB,BOX
449/CHARLOTTESVILLE//VA /22908; UNIV VIRGINIA,SCH MED,DEPT MOLEC PHYSIOL &
BIOLPHYS/CHARLOTTESVILLE//VA/22908 | JOURNAL OF MICROSCOPY-OXFORD,
1993, V171, SEP (SEP), P183-198 |
| ATOMIC-RESOLUTION
SCANNING-TUNNELING-MICROSCOPY WITH A GALLIUM-ARSENIDE TIP | NUNES
G; AMER NM | IBM CORP,THOMAS J WATSON RES CTR/YORKTOWN
HTS//NY/10598; IBM CORP,THOMAS J WATSON RES CTR/YORKTOWN HTS//NY/10598
| APPLIED PHYSICS LETTERS, 1993, V63, N13 (SEP 27), P1851-1853
|
| A MOLECULAR PHOTOIONIC AND GATE BASED ON FLUORESCENT
SIGNALING | DESILVA AP; GUNARATNE HQN; MCCOY CP | QUEENS
UNIV BELFAST,SCH CHEM/BELFAST BT9 5AG/ANTRIM/NORTH IRELAND/
| NATURE, 1993, V364, N6432 (JUL 1), P42-44 |
|
SCANNING-TUNNELING-MICROSCOPY STUDY OF ORIENTED POLY(TETRAFLUOROETHYLENE)
SUBSTRATES | BODO P; ZIEGLER C; RASMUSSON JR; SALANECK WR; CLARK
DT | LINKOPING UNIV,DEPT PHYS,IFM/S-58183 LINKOPING//SWEDEN/; UNIV
TUBINGEN,DEPT PHYS & THEORET CHEM/W-7400 TUBINGEN 1//GERMANY/; ICI
PLC,WILTON MAT RES CTR/CLEVELAND TS6 8JE//ENGLAND/ | SYNTHETIC
METALS, 1993, V55, N1 (MAR 15), P329-334 |
| AN
OPTICAL-DETECTION LOW-TEMPERATURE ATOMIC-FORCE MICROSCOPE AT AMBIENT
PRESSURE FOR BIOLOGICAL-RESEARCH | MOU JX; YANG J; SHAO ZF
| UNIV VIRGINIA,BIOSPM LAB,BOX 449/CHARLOTTESVILLE//VA/22908; UNIV
VIRGINIA,BIOSPM LAB,BOX 449/CHARLOTTESVILLE//VA/22908; UNIV VIRGINIA,DEPT
MOLEC PHYSIOL & BIOL PHYS/CHARLOTTESVILLE//VA/22908 | REVIEW OF
SCIENTIFIC INSTRUMENTS, 1993, V64, N6 (JUN), P1483-1489 |
| GROWTH MECHANISMS OF C-60-MOLECULAR BEAM EPITAXY ON MICA
| BUSMANN HG; HISS R; GABER H; HERTEL IV | UNIV
FREIBURG,FREIBURGER MAT FORSCHUNGSZENTRUM,STEFAN MEIER STR 31A/W-7800
FREIBURG//GERMANY/ | SURFACE SCIENCE, 1993, V289, N3 (JUN 1),
P381-388 |
| STRUCTURE AND MORPHOLOGY OF NANOSTRUCTURED
OXIDES SYNTHESIZED BY THERMAL VAPORIZATION MAGNETRON SPUTTERING AND GAS
CONDENSATION | YING JY | MIT,DEPT CHEM
ENGN/CAMBRIDGE//MA/02139 | JOURNAL OF AEROSOL SCIENCE, 1993, V24,
N3 (MAY), P315-338 |
| DATA ACQUISITION AND CONTROL-SYSTEM
FOR MOLECULE AND ATOM-RESOLVED TUNNELING SPECTROSCOPY | ALTMAN EI;
DILELLA DP; IBE J; LEE K; COLTON RJ | USN,RES LAB,DIV CHEM,CODE
6177/WASHINGTON//DC/20375 | REVIEW OF SCIENTIFIC INSTRUMENTS, 1993,
V64, N5 (MAY), P1239-1243 |
| AN ATOMIC-LEVEL VIEW OF
KINETIC AND THERMODYNAMIC INFLUENCES IN THE GROWTH OF THIN-FILMS |
LAGALLY MG UNIV WISCONSIN/MADISON//WI/53706 | JAPANESE JOURNAL OF
APPLIED PHYSICS PART 1-REGULAR PAPERS & SHORT NOTES, 1993, V32, N3B (MAR),
P1493-1501 |
| JUMPS IN ELECTRONIC CONDUCTANCE DUE TO
MECHANICAL INSTABILITIES | TODOROV TN; SUTTON AP | UNIV
OXFORD,DEPT MAT/OXFORD OX1 3PH//ENGLAND/ | PHYSICAL REVIEW LETTERS,
1993, V70, N14 (APR 5), P2138-2141 |
| A MINIATURIZED
SCANNING TUNNELING MICROSCOPE WITH LARGE OPERATION RANGE |
KLEINDIEK S; HERRMANN KH | INST ANGEW PHYS,AUF MORGENSTELLE
12/W-7400 TUBINGEN//GERMANY/ | REVIEW OF SCIENTIFIC INSTRUMENTS,
1993, V64, N3 (MAR), P6
92-693 |
| A DIGITAL-CONTROL SYSTEM FOR SCANNING TUNNELING
MICROSCOPY AND ATOMIC FORCE MICROSCOPY | WONG TMH; WELLAND ME
| UNIV CAMBRIDGE,DEPT ENGN,TRUMPINGTON ST/CAMBRIDGE CB2
1PZ//ENGLAND/ | MEASUREMENT SCIENCE & TECHNOLOGY, 1993,
V4, N3 (MAR), P270-280 |
| ASYMPTOTICS OF MANY-ELECTRON
WAVE-FUNCTIONS AND CALCULATION OF TUNNEL TRANSITIONS | IVANOV GK;
KOZHUSHNER MA | RAN,INST CHEM PHYS,KOSYGIN ST 4/MOSCOW
117977//RUSSIA/ | CHEMICAL PHYSICS, 1993, V170, N3 (MAR 15),
P303-313 |
| PROBING OF SURFACE ACOUSTIC-WAVE FIELDS BY A
NOVEL SCANNING TUNNELING MICROSCOPY TECHNIQUE - EFFECTS OF TOPOGRAPHY
| CHILLA E; ROHRBECK W; FROHLICH HJ; KOCH R; RIEDER KH
| PAUL DRUDE INST FESTKORPERLEKTRON,HAUSVOGTEIPL 5-7/BERLIN
//GERMANY/; FREE UNIV BERLIN,INST EXPTL PHYS/W-1000 BERLIN 33//GERMANY/
| APPLIED PHYSICS LETTERS, 1992, V61, N26 (DEC 28), P3107-3109
|
| LOCAL PROBE MICROSCOPIES AS A TOOL FOR LOCAL SURFACES
STUDIES | DUFOUR JP; DEFORNEL F; DAVID T; CERRE N; SALOMON L
| LAB PHYS SOLIDE,URA 785,BP 138/F-21004 DIJON//FRANCE/
| MATERIALS CHEMISTRY AND PHYSICS, 1992, V32, N3 (OCT), P267-272
|
| SCANNING SURFACE-POTENTIAL MICROSCOPY FOR
LOCAL SURFACE-ANALYSIS | FUJIHARA M; KAWATE H; YASUTAKE M
| TOKYO INST TECHNOL,DEPT BIOMOLEC ENGN,4259 NAGATSUTA,MIDORI
KU/YOKOHAMA/KANAGAWA 227/JAPAN/; SEIKO INSTRUMENTS INC,DEPT DEV,DIV
SCI INSTRUMENTS/MATSUDO/CHIBA 271/JAPAN/ | CHEMISTRY LETTERS,
1992, N11 (NOV), P2223-2226 |
| STM IMAGES OF
SURFACE-FILMS PRODUCED AT ELEVATED-TEMPERATURES | MATSUOKA S;
MASUDA H; IKEDA Y; AKAIKE K; OCHI Y | NATL RES INST MET,DIV
ENVIRONM PERFORMANCE,2-3-12 NAKAMEGURO,MEGURO KU/TOKYO 153//JAPAN/; NATL
RES INST MET,DIV FAILURE PHYS,MEGURO KU/TOKYO 153//JAPAN/; UNIV
ELECTROCOMMUN,DEPT MECH & CONTROL ENGN/CHOFU/TOKYO 182/JAPAN/
| JSME INTERNATIONAL JOURNAL SERIES I-SOLID MECHANICS STRENGTH OF
MATERIALS, 1992, V35, N4 (OCT), P456-461 |
| INSITU
OBSERVATION OF METAL-SURFACES IN AQUEOUS-SOLUTIONS WITH AN ELECTROCHEMICAL
STM | NAGASHIMA N; MASUDA H; MATSUOKA S | NATL RES INST
MET,DIV ENVIRONM PERFORMANCE,2-3-12 NAKAMEGURO,MEGURO KU/TOKYO
153//JAPAN/; NATL RES INST MET,DIV FAILURE PHYS,MEGURO KU/TOKYO
153//JAPAN/ | JSME INTERNATIONAL JOURNAL SERIES I-SOLID MECHANICS
STRENGTH OF MATERIALS, 1992, V35, N4 (OCT), P442-448 |
|
STM AFM STUDY OF GRAIN-BOUNDARY MIGRATION IN NANOSTRUCTURED SOLIDS
| YING JY; WANG GH; FUCHS H; LASCHINSKI R; GLEITER H | UNIV
SAARLAND,GEBAUDE 43/W-6600 SAARBRUCKEN//GERMANY/; MIT,DEPT CHEM
ENGN/CAMBRIDGE//MA/02139; BASF AG,POLYMER RES LAB/W-6700
LUDWIGSHAFEN//GERMANY/; NANJING UNIV,DEPT PHYS/NANJING//PEOPLES R CHINA/;
NANJING UNIV,INST SOLID STATE PHYS | MATERIALS LETTERS, 1992, V15,
N3 (NOV), P180-185 |
| THE SCANNING PROBE MICROSCOPE
| JAHANMIR J; HAGGAR BG; HAYES JB | WYKO CORP,2650 E ELVIRA
RD/TUCSON//AZ/85706 | SCANNING MICROSCOPY, 1992, V6, N3 (SEP),
P625-660 |
| ADSORPTION SITE OF ALKALI-METAL OVERLAYERS ON
SI(001) 2 X-1 | BATRA IP; CIRACI S | IBM CORP,DIV
RES,ALMADEN RES CTR,650 HARRY RD/SAN JOSE//CA/95120; BILKENT UNIV,DEPT
PHYS/ANKARA//TURKEY/ | ULTRAMICROSCOPY, 1992, V42, JUL (JUL),
P889-894 |
| SCANNING TUNNELING MICROSCOPY OF THE DAMAGE
INDUCED BY ION-BOMBARDMENT ON A GRAPHITE SURFACE | CORATGER R;
CHAHBOUN A; SIVEL V; AJUSTRON F; BEAUVILLAIN J | CNRS,CEMES,LOE,29
RUE J MARVIG,BP 4347/F-31055 TOULOUSE//FRANCE/ | ULTRAMICROSCOPY,
1992, V42, JUL (JUL), P653-659 |
| PROPERTIES OF
NOBLE-METAL SILICON JUNCTIONS | CROS A; MURET P | FAC SCI
LUMINY,DEPT PHYS,CNRS,URA 783,CASE 901/F-13288 MARSEILLE 9//FRANCE/;
CNRS,LEPES/F-38042 GRENOBLE//FRANCE/ | MATERIALS SCIENCE REPORTS,
1992, V8, N6-7 (JUN), P271-367 |
| FRICTION MEASUREMENTS
ON PHASE-SEPARATED THIN-FILMS WITH A MODIFIED ATOMIC FORCE MICROSCOPE
| OVERNEY RM; MEYER E; FROMMER J; BRODBECK D; LUTHI R; HOWALD L;
GUNTHERODT HJ; FUJIHIRA M; TAKANO H; GOTOH Y | UNIV BASEL,INST
PHYS,KLINGELBERGSTR 82/CH-4056 BASEL//SWITZERLAND/; IBM CORP,ALMADEN RES
CTR/SAN JOSE//CA/91520; TOKYO INST TECHNOL,DEPT BIOMOLEC ENGN,MIDORI
KU/YOKOHAMA/KANAGAWA 227/JAPAN/ | NATURE, 1992, V359, N6391 (SEP
10), P133-135 |
| INTERACTION FORCE DETECTION IN SCANNING
PROBE MICROSCOPY - METHODS AND APPLICATIONS | DURIG U; ZUGER O;
STALDER A | IBM CORP,DIV RES,ZURICH RES LAB/CH-8803
RUSCHLIKON//SWITZERLAND/ | JOURNAL OF APPLIED PHYSICS, 1992, V72,
N5 (SEP 1), P1778-1798 |
| SCANNING TUNNELING MICROSCOPY
| VANDELEEMPUT LEC; VANKEMPEN H | CATHOLIC UNIV
NIJMEGEN,MAT RES INST,TOERNOOIVELD/6525 ED NIJMEGEN//NETHERLANDS/
| REPORTS ON PROGRESS IN PHYSICS, 1992, V55, N8 (AUG), P1165-1240
|
| OBSERVATION OF THE INVERTED HEXAGONAL PHASE OF LIPIDS
BY SCANNING TUNNELING MICROSCOPY | ZENG K; LIN KC | BEIJING
MED UNIV,DEPT BIOPHYS/BEIJING 100083//PEOPLES R CHINA/ | BIOCHIMICA
ET BIOPHYSICA ACTA, 1992, V1127, N2 (JUL 29), P157-162 |
|
FOCUSING OF ION-BEAM UNDER MASS-TRANSFER FROM THE POINT | BARYUDIN
LE; BULATOV VL; TELNOV DA ST PETERBURG UNIV/ST PETERBURG//USSR/
| ZHURNAL TEKHNICHESKOI FIZIKI, 1991, V61, N11 (NOV), P172-178
|
| TIP FOR SCANNING TUNNELING MICROSCOPY MADE OF
MONOCRYSTALLINE, SEMICONDUCTING, CHEMICAL VAPOR-DEPOSITED DIAMOND
| VISSER EP; GERRITSEN JW; VANENCKEVORT WJP; VANKEMPEN H
| DRUKKER INT BV,BEVERSESTR 20/5431 SH CUIJK//NETHERLANDS/;
CATHOLIC UNIV NIJMEGEN,MAT RES INST/6525 ED NIJMEGEN//NETHERLANDS/
| APPLIED PHYSICS LETTERS, 1992, V60, N26 (JUN 29), P3232-3234
|
| PROGRESS TOWARDS SPIN-POLARIZED SCANNING TUNNELING
MICROSCOPY | SHVETS IV; WIESENDANGER R; BURGLER D; TARRACH G;
GUNTHERODT HJ; COEY JMD | UNIV BASEL,INST PHYS,KLINGELBERGSTR
82/CH-4056 BASEL//SWITZERLAND/; UNIV DUBLIN TRINITY COLL,DEPT PHYS/DUBLIN
2//IRELAND/ | JOURNAL OF APPLIED PHYSICS, 1992, V71, N11 (JUN 1),
P5489-5499 |
| ATOMIC-SCALE MANIPULATION IN AIR WITH THE
SCANNING TUNNELING MICROSCOPE | GARCIA RG | UNIV
OREGON,INST MOLEC BIOL/EUGENE//OR/97403 | APPLIED PHYSICS LETTERS,
1992, V60, N16 (APR 20), P1960-1962 |
| 1ST INVESTIGATIONS
ON THE USE OF SCANNING TUNNELING MICROSCOPY (STM) FOR THE CHARACTERIZATION
OF POROUS MEMBRANES | CHAHBOUN A; CORATGER R; AJUSTRON F;
BEAUVILLAIN J; AIMAR P; SANCHEZ V | LGCE,CNRS,URA GENIE CHIM,118
ROUTE NARBONNE/F-31062 TOULOUSE//FRANCE/; LGCE,CNRS,URA GENIE CHIM,118
ROUTE NARBONNE/F-31062 TOULOUSE//FRANCE/; CNRS,CEMES/F-31055
TOULOUSE//FRANCE/ | JOURNAL OF MEMBRANE SCIENCE, 1992, V67, N2-3
(MAR 20), P295-300 |
| CHARACTERIZATION OF STM W TIPS BY
FIM WITH AN ORGANIC IMAGE GAS | SCHMIDT U; RASCH H; FRIES T;
ROLLGEN FW; WANDELT K | UNIV BONN,INST PHYS & THEORET
CHEM,WEGELERSTR 12/W-5300 BONN 1//GERMANY/ | SURFACE SCIENCE, 1992,
V266, N1-3 (APR 15), P249-252 |
| EXPERIMENTAL-OBSERVATION
OF THE TRANSITION FROM WEAK LINK TO TUNNEL JUNCTION | MULLER CJ;
VANRUITENBEEK JM; DEJONGH LJ | LEIDEN UNIV,KAMERLINGH ONNES LAB,POB
9506/2300 RA LEIDEN//NETHERLANDS/ | PHYSICA C, 1992, V191, N3-4
(FEB 15), P485-504 |
| 2-DIMENSIONAL PN-JUNCTION
DELINEATION ON CLEAVED SILICON SAMPLES WITH AN ULTRAHIGH-VACUUM SCANNING
TUNNELING MICROSCOPE | KORDIC S; VANLOENEN EJ; WALKER AJ
| PHILIPS RES LABS,POB 80000/5600 JA EINDHOVEN//NETHERLANDS/
| JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B-MICROELECTRONICS
PROCESSING AND PHENOMENA, 1992, V10, N1 (JAN-FEB), P496-501 |
| EFFECTS OF ION MASS AND ENERGY ON THE DAMAGE INDUCED BY AN
ION-BEAM ON GRAPHITE SURFACES - A SCANNING TUNNELING MICROSCOPY STUDY
| CORATGER R; CLAVERIE A; CHAHBOUN A; LANDRY V; AJUSTRON F;
BEAUVILLAIN J | CNRS,CEMES LOE,29 RUE J MARVIG,BP 4347/F-31055
TOULOUSE//FRANCE/ | SURFACE SCIENCE, 1992, V262, N1-2 (FEB 1),
P208-218 |
| SURFACE OF BISRCACUO SINGLE-CRYSTAL OBSERVED
BY MEANS OF SCANNING TUNNELING MICROSCOPE | WITEK A; REICH A;
CZAJKA R; PAJACZKOWSKA A; RAULUSZKIEWICZ J | POLISH ACAD SCI,INST
PHYS,AL LOTNIKOW 32/PL-02668 WARSAW//POLAND/; POZNAN TECH UNIV,INST
PHYS/PL-60965 POZNAN//POLAND/ | ACTA PHYSICA POLONICA A, 1991, V80,
N5 (NOV), P717-722 |
| MODELING TUNNELING DATA OF NORMAL
METAL-OXIDE SUPERCONDUCTOR POINT CONTACT JUNCTIONS | SRIKANTH H;
RAYCHAUDHURI AK | INDIAN INST SCI,DEPT PHYS/BANGALORE
560012/KARNATAKA/INDIA/ | PHYSICA C, 1992, V190, N3 (JAN 1),
P229-233
|
| FOCUSING OF THE ION-BEAM FROM A SCANNING TUNNELING
MICROSCOPE TIP | BARYUDIN LE; BULATOV VL; TELNOV DA
| LENINGRAD STATE UNIV,INST PHYS/LENINGRAD 198904//USSR/
| JOURNAL OF APPLIED PHYSICS, 1992, V71, N2 (JAN 15), P946-949
|
| SPECTROSCOPY - MOLECULAR COMPUTER MEMORY |
HAARER D | UNIV BAYREUTH,DEPT EXPTL PHYS/W-8580 BAYREUTH//GERMANY/
| NATURE, 1992, V355, N6358 (JAN 23), P297-298 |
|
THE MAGNETOSTRICTION OF COFENIMO METALLIC GLASSES MEASURED WITH A
TUNNELING TRANSDUCER | BRIZZOLARA RA; COLTON RJ | USN,CTR
SURFACE WARFARE,CODE R34,SURFACE EVALUAT FACIL 30-213/SILVER
SPRING//MD/20903; USN,RES LAB,DIV CHEM,CODE
6177/WASHINGTON//DC/20375 | JOURNAL OF MAGNETISM AND MAGNETIC
MATERIALS, 1992, V103, N1-2 (JAN ), P111-116 |
| SAMPLE
TIP COUPLING EFFICIENCIES OF THE PHOTON-SCANNING TUNNELING MICROSCOPE
| SALOMON L; DEFORNEL F; GOUDONNET JP | UNIV BOURGOGNE,FAC
SCI MIRANDE,PHYS SOLIDE LAB,PHOTOELECT SECT,UA 785,BP 138/F-21004
DIJON//FRANCE/ | JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS
AND IMAGE SCIENCE, 1991, V8, N12 (DEC), P2009-2015 |
|
LIMITS OF IMAGING RESOLUTION FOR ATOMIC FORCE MICROSCOPY OF MOLECULES
| WEIHS TP; NAWAZ Z; JARVIS SP; PETHICA JB | DEPT MAT,PARKS
RD/OXFORD OX1 3PH//ENGLAND/ | APPLIED PHYSICS LETTERS, 1991, V59,
N27 (DEC 30), P3536-3538 |
| SCANNING TUNNELING MICROSCOPY
OF MARINE HYDROTHERMAL SEDIMENTS | KOEPPENKASTROP D; DECARLO EH;
LEWIS S | UNIV HAWAII,SCH OCEAN & EARTH SCI & TECHNOL,DEPT
OCEANOG,1000 POPE RD/HONOLULU//HI/96822; UNIV HAWAII,SCH OCEAN & EARTH SCI
& TECHNOL,DEPT OCEANOG,1000 POPE RD/HONOLULU//HI/96822; UNIV HAWAII,DEPT
CHEM/HONOLULU//HI/96822 | GEOCHIMICA ET COSMOCHIMICA ACTA, 1991,
V55, N11, P3459-3465 |
| STM IMAGING OF THE SURFACE OF
SMALL METAL PARTICLES FORMED IN ANODIC OXIDE PORES | PONTIFEX GH;
ZHANG P; WANG Z; HASLETT TL; ALMAWLAWI D; MOSKOVITS M | UNIV
TORONTO,DEPT CHEM/TORONTO M5S 1A1/ONTARIO/CANADA/; UNIV TORONTO,DEPT
CHEM/TORONTO M5S 1A1/ONTARIO/CANADA/; UNIV TORONTO,ONTARIO LASER &
LIGHTWAVE RES CTR/TORONTO M5S 1A1/ONTARIO/CANADA/ | JOURNAL OF
PHYSICAL CHEMISTRY, 1991, V95, N24, P9989-9993 |
|
NANOMETER-SCALE FEATURES PRODUCED BY ELECTRIC-FIELD EMISSION |
MCBRIDE SE; WETSEL GC | UNIV TEXAS,ERIK JONSSON SCH ENGN & COMP
SCI/RICHARDSON//TX/75083 | APPLIED PHYSICS LETTERS, 1991, V59, N23,
P3056-3058 |
| RECENT ADVANCES IN SCANNING TUNNELING
MICROSCOPY INVOLVING MAGNETIC PROBES AND SAMPLES | WIESENDANGER R;
BURGLER D; TARRACH G; SCHAUB T; HARTMANN U; GUNTHERODT HJ; SHVETS IV;
COEY JMD | UNIV BASEL,DEPT PHYS,KLINGELBERGSTR 82/CH-4056
BASEL//SWITZERLAND/; UNIV DUBLIN TRINITY COLL,DEPT PHYS/DUBLIN 2//IRELAND/
| APPLIED PHYSICS A-SOLIDS AND SURFACES, 1991, V53, N5, P349-355
|
| IMPROVED SCANNING ION-CONDUCTANCE MICROSCOPE USING
MICROFABRICATED PROBES | PRATER CB; HANSMA PK; TORTONESE M; QUATE
CF | UNIV CALIF SANTA BARBARA,DEPT PHYS/SANTA BARBARA//CA/93106;
STANFORD UNIV,DEPT APPL PHYS/STANFORD//CA/94305
| REVIEW OF SCIENTIFIC INSTRUMENTS, 1991, V62, N11, P2634-2638
|
| DIRECT AND REVERSE PROBLEM FOR STM-IMAGE OF NANOMETER
DIELECTRIC CLUSTER ON CONDUCTOR SURFACE | SUMETSKII MY; FELSHTYN
ML | PISMA V ZHURNAL TEKHNICHESKOI FIZIKI, 1991, V17, N12, P34-37
Language: RUSSIAN Document Type: ARTICLE
1/3/210 |
| A FULLY COMPUTERIZED MODULAR SCANNING
TUNNELING MICROSCOPE SYSTEM | FRIES T; BECKER C; BOHMER M; WANDELT
K | UNIV BONN,INST PHYS CHEM,WEGELER STR 12/D-5300 BONN 1//FED REP
GER/ | FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 1991, V341, N3-4,
P 193-195 |
| A FULLY COMPUTER-CONTROLLED, LOW-COST STM
| WENZEL M; EHINGER M; BICKNELLTASSIUS RN; LANDWEHR G
| UNIV WURZBURG,INST PHYS/D-8700 WURZBURG//FED REP GER/
| FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 1991, V341, N3-4, P
189-192 |
| CHARACTERIZATION OF ULTRAFILTRATION MEMBRANES
USING STM | CHAHBOUN A; CORATGER R; AJUSTRON F; BEAUVILLAIN J;
AIMAR P; SANCHEZ V | CEMES,LOE,CNRS,29 RUE J MARVING,BP
4347/F-31055TOULOUSE//FRANCE/; UNIV TOULOUSE 3,GENIE CHIM LAB,CNRS,URA
192/F-31062 TOULOUSE//FRANCE/ | MICROSCOPY MICROANALYSIS
MICROSTRUCTURES, 1991, V2, N4, P493-500 |
| THE IMAGE
POTENTIAL IN SCANNING TUNNELING MICROSCOPY OF SEMICONDUCTOR SURFACES
| HUANG ZH; WEIMER M; ALLEN RE | TEXAS A&M UNIV SYST,DEPT
PHYS/COLLEGE STN//TX/77843 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY
B-MICROELECTRONICS
PROCESSING AND PHENOMENA, 1991, V9, N4, P2399-2404 |
|
REAL-SPACE IMAGING OF SINGLE-LAYER MOS2 BY SCANNING TUNNELING MICROSCOPY
| QIN XR; YANG D; FRINDT RF; IRWIN JC | SIMON FRASER
UNIV,DEPT PHYS/BURNABY V5A 1S6/BC/CANADA/ | PHYSICAL REVIEW
B-CONDENSED MATTER, 1991, V44, N7, P3 490-3493 |
|
CALCULATION OF AN ATOMICALLY MODULATED FRICTION FORCE IN ATOMIC-FORCE
MICROSCOPY | TOMANEK D; ZHONG W; THOMAS H | MICHIGAN STATE
UNIV,DEPT PHYS & ASTRON/E LANSING//MI/48824; MICHIGAN STATE UNIV,CTR
FUNDAMENTAL MAT RES/E LANSING/ /MI/48824; UNIV BASEL,INST PHYS/CH-4056
BASEL//SWITZERLAND/ | EUROPHYSICS LETTERS, 1991, V15, N8, P887-892
|
| ALTERNATIVE METHOD OF IMAGING SURFACE TOPOLOGIES OF
NONCONDUCTING BULK SPECIMENS BY SCANNING TUNNELING MICROSCOPY |
YUAN JY; SHAO ZF; GAO C | MCGILL UNIV,DEPT CHEM/MONTREAL H3A
2K6/QUEBEC/CANADA/; UNIV VIRGINIA,DEPT PHYSIOL/CHARLOTTESVILLE//VA/22908;
UNIV VIRGINIA,DEPT MAT SCI/CHARLOTTESVILLE//VA/22901 | PHYSICAL
REVIEW LETTERS, 1991, V67, N7, P863-866 |
| 2-DIMENSIONAL
IMAGING OF CLEAVED SI P-N-JUNCTIONS WITH 30-NM RESOLUTION USING A UHV
SCANNING TUNNELING MICROSCOPE | KORDIC S; VANLOENEN EJ; WALKER AJ
PHILIPS RES LABS/5600 JA EINDHOVEN//NETHERLANDS/ | IEEE ELECTRON
DEVICE LETTERS,
1991, V12, N8, P422-424 |
| IS SCANNING TUNNELING
MICROSCOPY A USEFUL TOOL FOR PROBING THE SURFACE-POTENTIAL |
GARCIAGARCIA R; SAENZ JJ | UNIV NEW MEXICO,DEPT
CHEM/ALBUQUERQUE//NM/87131; UNIV AUTONOMA MADRID,DEPT FIS MAT CONDENSADA
C3/E-28049 MADRID//SPAIN/
| SURFACE SCIENCE, 1991, V251, JUL, P223-227 |
|
STUDIES AND CALIBRATION OF THE DISPLACEMENTS OF A PIEZOELECTRIC TUBE USED
IN THE SCANNING SYSTEM OF SCANNING TUNNELING MICROSCOPE | DUFOUR
JP; BOURILLOT E; GOUDONNET JP | UNIV BOURGOGNE,PHYS SOLIDE LAB,URA
785,BP 138/F-21004 DIJON//FRANCE/ | JOURNAL DE PHYSIQUE III, 1991,
V1, N7, P1337-1348 |
| MAIN PARAMETERS OF PARALLEL DOUBLE
HELIX OF DNA OBTAINED BY SCANNING TUNNELING MICROSCOPY | ZHU JD;
LI MQ; XUI LZ; ZHU JQ; HU J; GU MM; XU YL; ZHANG LP; HUANG ZQ; CHERNOV
BK; NECHIPURENKO YD; CHURIKOV NA | CHINESE ACAD GEOL SCI,INST CELL
BIOL/BEIJING//PEOPLES R CHINA/; CHINESE ACAD GEOL SCI,INST NUCL
RES/BEIJING//PEOPLES R CHINA/; VA ENGELGARDT MOLEC BIOL
INST/MOSCOW//USSR/ | DOKLADY AKADEMII NAUK SSSR, 1991, V317, N5,
P1250& |
| TUNNELING FROM A 3-DIMENSIONAL QUANTUM-WELL IN
AN ELECTRIC-FIELD - AN ANALYTIC SOLUTION | GOTTLIEB B; KLEBER M;
KRAUSE J | TECH UNIV MUNICH,DEPT PHYS T30/D-8046 GARCHING//FED REP
GER/ | ZEITSCHRIFT FUR PHYSIK A-HADRONS AND
NUCLEI, 1991, V339, N1, P 201-206 |
| POINT-CONTACT
I-V-CHARACTERISTICS OF THE ELECTROLUMINESCENT ZNS-MN, CU THIN-FILMS
STUDIED BY STM | SZUBA S; CZAJKA R; GORDON WS; POLEWSKA W
| POZNAN TECH UNIV,INST PHYS,PIOTROWO 3/PL-60965 POZNAN//POLAND/;
POLISH ACAD SCI,INST PHYS/PL-02668 WARSAW//POLAND/ | ACTA PHYSICA
POLONICA A, 1991, V79, N2-3, P171-174 |
| LITHOGRAPHY ON
SI BY MEANS OF STM AND SEM | GOMEZRODRIGUEZ JM; BARO AM
| UNIV AUTONOMA MADRID,DEPT FIS MAT CONDENSADA C-III/E-28049
MADRID//SPAIN/ | INSTITUTE OF PHYSICS CONFERENCE SERIES, 1989, N99,
P177-180 |
| PALLADIUM-GRAPHITE INTERACTION POTENTIALS
BASED ON 1ST-PRINCIPLES CALCULATIONS | TOMANEK D; ZHONG W
| MICHIGAN STATE UNIV,DEPT PHYS & ASTRON/E LANSING//MI/48824;
MICHIGAN STATE UNIV,CTR FUNDAMENTAL MAT RES/E LANSING//MI/48824
| PHYSICAL REVIEW B-CONDENSED MATTER, 1991, V43, N15, P12623-12625
|
| DETECTION OF SURFACE ACOUSTIC-WAVES BY SCANNING
TUNNELING MICROSCOPY | ROHRBECK W; CHILLA E; FROHLICH HJ; RIEDEL J
| ZENT INST ELEKTRONENPHYS,HAUSVOGTEIPLATZ 5-7/D-1086 BERLIN//FED
REP GER/ | APPLIED PHYSICS A-SOLIDS AND SURFACES, 1991, V52, N5,
P344-347 |
| SURFACE-STRUCTURE STUDIES OF
QUASI-ONE-DIMENSIONAL CHARGE-DENSITY WAVE COMPOUNDS BY SCANNING TUNNELING
MICROSCOPY | GAMMIE G; HUBACEK JS; SKALA SL; TUCKER JR; LYDING JW
| UNIV ILLINOIS,DEPT ELECT & COMP ENGN/URBANA//IL/61801; UNIV
ILLINOIS,MAT RES LAB/URBANA//IL/61801 | JOURNAL OF VACUUM SCIENCE &
TECHNOLOGY B-MICROELECTRONICS PROCESSING AND PHENOMENA, 1991, V9, N2,
P1027-1031 |
| SCANNING TUNNELING MICROSCOPY OBSERVATIONS
OF METALLIC CLUSTERS PD-561 AND AU-55 AND THE IMPLICATIONS OF THEIR USE AS
A WELL DEFINED TIP | VANDELEEMPUT LEC; GERRITSEN JW; RONGEN PHH;
SMOKERS RTM; WIERENGA HA; VANKEMPEN H; SCHMID G | CATHOLIC UNIV
NIJMEGEN,MAT RES INST/6525 ED NIJMEGEN//NETHERLANDS/; UNIV ESSEN
GESAMTHSCH,INST ANORGAN CHEM/D-4300 ESSEN 1//FED REP GER/ | JOURNAL
OF VACUUM SCIENCE & TECHNOLOGY B-MICROELECTRONICS PROCESSING AND
PHENOMENA, 1991, V9, N2, P814-819 |
| SCANNING TUNNELING
MICROSCOPY INVESTIGATION OF STABILIZED AU55 CLUSTERS | BECKER C;
FRIES T; WANDELT K; KREIBIG U; SCHMID G | UNIV BONN,INST PHYS
CHEM,WEGELERSTR 12/D-5300 BONN 1//FED REP GER/; UNIV SAARLAND,FACHBEREICH
PAYS 11/D-6600 SAARBRUCKEN//FED REP GER/; UNIV ESSEN GESAMTHSCH,INST
ANORGAN CHEM/D-4300 ESSEN 1//FED REP GER/ | JOURNAL OF VACUUM
SCIENCE & TECHNOLOGY B-MICROELECTRONICS PROCESSING AND PHENOMENA, 1991,
V9, N2, P810-813 |
| ROLE OF ATOMIC FORCE IN
TUNNELING-BARRIER MEASUREMENTS | CHEN CJ; HAMERS RJ | IBM
CORP,THOMAS J WATSON RES CTR,DIV RES/YORKTOWN HTS//NY/10598
| JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B-MICROELECTRONICS
PROCESSING AND PHENOMENA, 1991, V9, N2, P503-505 |
|
COORDINATION AT SOLID-SURFACES - INVESTIGATIONS ON THE ATOMIC SCALE BY
FIELD-ION MICROSCOPIC TECHNIQUES | BLOCK JH | MAX PLANCK
GESELL,FRITZ HABER INST,FARADAYWEG 4-6/D-1000 BERLIN 33//FED REP GER/
| PURE AND APPLIED CHEMISTRY, 1991, V63, N5, P697-710 |
| LIMITS OF RESOLUTION IN ATOMIC FORCE MICROSCOPY IMAGES OF
GRAPHITE | ZHONG W; OVERNEY G; TOMANEK D | MICHIGAN STATE
UNIV,CTR FUNDAMENTAL MAT RES,DEPT PHYS & ASTRON/E LANSING//MI/48824
| EUROPHYSICS LETTERS, 1991, V15, N1, P
49-54 |
| SCANNING TUNNELING MICROSCOPE (STM) FOR
CONVENTIONAL TRANSMISSION ELECTRON-MICROSCOPE (TEM) | IWATSUKI M;
MUROOKA K; KITAMURA S; TAKAYANAGI K; HARADA Y | JEOL LTD,1-2
MUSASHINO 3 CHOME/TOKYO 196//JAPAN/; TOKYO INST TECHNOL,MIDORI
KU/YOKOHAMA/KANAGAWA 227/JAPAN/ | JOURNAL OF ELECTRON MICROSCOPY,
1991, V40, N1, P48-53 |
| SCANNING TUNNELING |
TANG SL | DUPONTS CENT RES & DEV,EXPTL STN/WILMINGTON//DE/19898
| CHEMTECH, 1991, V21, N3, P182-189 |
| ATTRACTIVE
INTERATOMIC FORCE AS A TUNNELING PHENOMENON | CHEN CJ | IBM
CORP,THOMAS J WATSON RES CTR,POB 218/YORKTOWN HTS//NY/10598
| JOURNAL OF PHYSICS-CONDENSED MATTER, 1991, V3, N10, P1227-1245
|
| A STAGE FOR SUBMICRON DISPLACEMENTS USING
ELECTROMAGNETIC COILS AND ITS APPLICATION TO SCANNING TUNNELING MICROSCOPY
| CORATGER R; BEAUVILLAIN J; AJUSTRON F; LACAZE JC; TREMOLLIERES C
| CEMES,CNRS,LOE,29 RUE J MARVIG,BP 4347/F-31055 TOULOUSE//FRANCE/
| REVIEW OF SCIENTIFIC INSTRUMENTS, 1991, V62, N3, P830-831
|
| POINT CONTACT TUNNELING STUDIES ON CERAMIC YBCO WITH
SCANNING TUNNELING MICROSCOPE TIPS | SRIKANTH H; RAJESWARI M;
RAYCHAUDHURI AK | INDIAN INST SCI,DEPT PHYS/BANGALORE
560012/KARNATAKA/INDIA/ | PRAMANA-JOURNAL OF PHYSICS,
1991, V36, N2, P207-219 |
| ROLES OF THE ATTRACTIVE AND
REPULSIVE FORCES IN ATOMIC-FORCE MICROSCOPY | GOODMAN FO; GARCIA N
| UNIV WATERLOO,DEPT APPL MATH/WATERLOO N2L 3G1/ONTARIO/CANADA/;
GUELPH WATERLOO PROGRAMME GRAD WORK PHYS,DEPT PHYS/WATERLOO/ONTARIO/
CANADA/; UNIV AUTONOMA MADRID,DEPT FIS FUNDAMENTAL/E-28049 MADRID//SPAIN/
| PHYSICAL REVIEW B-CONDENSED MATTER, 1991, V43, N6, P4728-4731
|
| SCANNING TUNNELING MICROSCOPY - A CRITICAL-VIEW OF TIP
PARTICIPATION | WOMELSDORF JF; SAWAMURA M; ERMLER WC
| STEVENS INST TECHNOL LIB,DEPT CHEM & CHEM ENGN/HOBOKEN//NJ/07030;
STEVENS INST TECHNOL LIB,DEPT PHYS & ENGN/HOBOKEN//NJ
/07030 | SURFACE SCIENCE, 1991, V241, N1-2, PL11-L15 |
| AN X-Y-Z STAGE FOR SCANNING PROXIMITY MICROSCOPES USING ELASTIC
ELEMENTS | MCCORD MA | IBM CORP,THOMAS J WATSON RES CTR,POB
218/YORKTOWN HTS//NY/10598 | REVIEW OF SCIENTIFIC INSTRUMENTS,
1991, V62, N2, P530-531 |
| SCANNING TUNNELING MICROSCOPY
OF THE ANNEALING OF A THIN PLATINUM FILM ON HIGHLY ORIENTED
PYROLYTIC-GRAPHITE | ZHOU XC; GULARI E | UNIV MICHIGAN,DEPT
CHEM ENGN/ANN ARBOR//MI/48109; UNIV MICHIGAN,DEPT CHEM ENGN/ANN
ARBOR//MI/48109
| ACTA CRYSTALLOGRAPHICA SECTION A-FOUNDATIONS OF CRYSTALLOGRAPHY,
1991, V47, JAN, P17-21 |
| SCANNING TUNNELING MICROSCOPY
OF A LIQUID-CRYSTALLINE PHASE OF POLY((DA-DT).(DA-DT)) INDUCED BY A
HISTONE H-1 PEPTIDE | CORATGER R; CHAHBOUN A; AJUSTRON F;
BEAUVILLAIN J; ERARD M; AMALRIC F | CNRS,CEMES,LOE,29 RUE J
MARVIG/F-31055 TOULOUSE//FRANCE/; CNRS,CRBGC/F-31062 TOULOUSE//FRANCE/
| ULTRAMICROSCOPY, 1990, V34, N3, P141-147 |
|
QUANTITATIVE CHARACTERIZATION OF PHYSICAL PROCESSES DURING NANOMETER
SURFACE MODIFICATION | MCBRIDE SE; WETSEL GC | UNIV
TEXAS,ERIK JONSSON SCH ENGN & COMP SCI/RICHARDSON//TX/75083
| APPLIED PHYSICS LETTERS, 1990, V57, N26, P2782-2784 |
| ATOMIC-STRUCTURE, MICROTOPOGRAPHY, COMPOSITION, AND REACTIVITY OF
MINERAL SURFACES | HOCHELLA MF | STANFORD UNIV,DEPT
GEOL/STANFORD//CA/94305 | REVIEWS IN MINERALOGY, 1990, V23, P87-132
|
| INVESTIGATION OF GALLIUM-ARSENIDE MULTILAYER
STRUCTURES USING A TUNNELING MICROSCOPE COMBINED WITH A UHV-SEM |
ALBREKTSEN O; SALEMINK H | IBM CORP,DIV RES,ZURICH RES LAB/CH-8803
RUSCHLIKON//SWITZERLAND/ | SURFACE AND INTERFACE ANALYSIS, 1990,
V15, N11, P659-662 |
| IRRADIATION-INDUCED NANOMETER-SCALE
SURFACE ETCHING OF A CDSE FILM WITH A SCANNING TUNNELING MICROSCOPE
| LIU CY; BARD AJ | UNIV TEXAS,DEPT CHEM/AUSTIN//TX/78712
| CHEMICAL PHYSICS LETTERS, 1990, V174, N2, P162-166 |
| TUNNELING CHARACTERISTICS OF DIFFERENT MODELS FOR THE
METAL-VACUUM-METAL BARRIER | GARCIA R | UNIV AUTONOMA
MADRID,DEPT FIS MAT CONDENSADA,C-III,CIUDAD UNIV CANTO BLANCO/E-28049
MADRID 34//SPAIN/ | PHYSICAL REVIEW B-CONDENSED MATTER, 1990, V42,
N9, P5476-5480 |
| MAGNETOSTRICTION MEASUREMENTS USING A
TUNNELING-TIP STRAIN DETECTOR | BRIZZOLARA RA; COLTON RJ
| USN,RES LAB,DIV CHEM,CODE 6177/WASHINGTON//DC/20375
| JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 1990, V88, N3, P
343-350 |
| PHOTOCHEMISTRY OF ADSORBED MOLECULES .7.
ULTRAVIOLET PHOTOEJECTION AND PHOTODESORPTION OF OCS ON LIF(001) |
POLANYI JC; YOUNG PA | UNIV TORONTO,DEPT CHEM/TORONTO M5S
1A1/ONTARIO/CANADA/ | JOURNAL OF CHEMICAL PHYSICS, 1990, V93, N5,
P3673-3684 |
| FIELD ION-SCANNING TUNNELING MICROSCOPY
| SAKURAI T; HASHIZUME T; KAMIYA I; HASEGAWA Y; SANO N; PICKERING
HW; SAKAI A | UNIV TOKYO,INST SOLID STATE PHYS,MINATO KU/TOKYO
106//JAPAN/; TOHOKU UNIV,INST MAT RES,AOBA KU/SENDAI/MIYAGI 980/JAPAN/
| PROGRESS IN SURFACE SCIENCE, 1990, V33, N1, P3-89 |
| TUNNELING SPECTROSCOPY - SURFACE GEOMETRY AND INTERFACE POTENTIAL
EFFECTS | PITARKE JM; FLORES F; ECHENIQUE PM | EUSKAL
HERRIKO UNIBERTSITATEA,FAK ZIENTZI,644 POSTA KUTXATILA/E-48080
BILBAO//SPAIN/; UNIV AUTONOMA MADRID,DEPT FIS MAT CONDENSADA C-12/E-28049
MADRID//SPAIN/; EUSKAL HERRIKO UNIBERTSITATEA,FAK KIMIKA/E-20080
DONOSTIA//SPAIN/ | SURFACE SCIENCE, 1990, V234, N1-2, P1-16
|
| SIMPLE STM THEORY | BARNIOL N; FARRES E;
MARTIN F; SUNE J; PLACENCIA I; AYMERICH X | UNIV AUTONOMA
BARCELONA,DEPT FIS ELECTRON/E-08193 BARCELONA//SPAIN/ | VACUUM,
1990, V41, N1-3, P379-381 |
| SCANNING TUNNELING
MICROSCOPY OF THIN ORGANIC FILMS ON CONDUCTING SUBSTRATES | DIETZ
P; HERRMANN KH | UNIV TUBINGEN,INST ANGEW PHYS,MORGENSTELLE
12/D-7400 TUBINGEN 1//FED REP GER/ | SURFACE SCIENCE, 1990, V232,
N3, P339-345 |
| ON THE QUADRANT THEOREM OF OROWAN
| GOODMAN FO | UNIV WATERLOO,DEPT APPL MATH/WATERLOO N2L
3G1/ONTARIO/CANADA/; UNIV WATERLOO,DEPT PHYS/WATERLOO N2L
3G1/ONTARIO/CANADA/ | SURFACE SCIENCE, 1990, V232, N3, PL224-L226
|
| SCANNING TUNNELING MICROSCOPY, RESONANT TUNNELING, AND
COUNTING ELECTRONS - A QUANTUM STANDARD OF CURRENT | GUINEA F;
GARCIA N | UNIV AUTONOMA MADRID,FAC CIENCIAS,INST CIENCIA
MAT/E-28049 MADRID//SPAIN/; UNIV AUTONOMA MADRID,FACCIENCIAS,DEPT FIS MAT
CONDENSADA/E-28049 MADRID//SPAIN/ | PHYSICAL REVIEW LETTERS, 1990,
V65, N3, P281-284 |
| A SCANNING TUNNELING MICROSCOPE WITH
A WIDE SAMPLING RANGE | HIPPS KW; FRIED G; FRIED D
| WASHINGTON STATE UNIV,CHEM PHYS PROGRAM/PULLMAN//WA/99164
| REVIEW OF SCIENTIFIC INSTRUMENTS, 1990, V61, N7, P1869-1873
|
| ATOMISTIC LOCKING AND FRICTION | HIRANO M;
SHINJO K | NIPPON TELEGRAPH & TEL PUBL CORP,MUSASHINO ELECT COMMUN
LAB,APPL ELECTR LABS/MUSASHINO/TOKYO 180/JAPAN/; NIPPON TELEGRAPH & TEL
PUBL CORP,MUSASHINO ELECT COMMUN LAB,BASIC RES LABS/MUSASHINO/TOKYO
180/JAPAN/ | PHYSICAL REVIEW B-CONDENSED MATTER, 1990, V41, N17,
P11837-11851 |
| 1ST-PRINCIPLES THEORY OF ATOMIC-SCALE
FRICTION | ZHONG W; TOMANEK D | MICHIGAN STATE UNIV,DEPT
PHYS & ASTRON/E LANSING//MI/48824; MICHIGAN STATE UNIV,CTR FUNDAMENTAL MAT
RES/E LANSING//MI/48824 | PHYSICAL REVIEW LETTERS, 1990, V64, N25,
P3054-3057 |
| A MULTIPROCESSOR DATA ACQUISITION AND
ANALYSIS SYSTEM FOR SCANNING TUNNELING MICROSCOPY | HOEVEN AJ;
VANLOENEN EJ; VANHOOFT PJGM; OOSTVEEN K | PHILIPS RES LABS,POB
80000/5600 JA EINDHOVEN//NETHERLANDS/ | REVIEW OF SCIENTIFIC
INSTRUMENTS, 1990, V61, N6, P1668-1673 |
| INSITU
TOPOGRAPHICAL IMAGING OF ELECTRODE SURFACES USING HIGH-RESOLUTION
PHASE-MEASUREMENT INTERFEROMETRIC MICROSCOPY | WHITE HS; EARL DJ;
NORTON JD; KRAGT HJ | UNIV MINNESOTA,DEPT CHEM ENGN & MAT
SCI/MINNEAPOLIS//MN/55455 | ANALYTICAL CHEMISTRY, 1990, V62, N11,
P1130-1134 |
| SPIN-POLARIZED SCANNING TUNNELING
MICROSCOPE - CONCEPT, DESIGN, AND PRELIMINARY-RESULTS FROM A PROTOTYPE
OPERATED IN AIR | JOHNSON M; CLARKE J | UNIV CALIF
BERKELEY,DEPT PHYS/BERKELEY//CA/94720; UNIV CALIF BERKELEY LAWRENCE
BERKELEY LAB,DIV MAT & CHEM SCI/BERKELEY//CA/94720; UNIV CALIF BERKELEY
LAWRENCE BERKELEY LAB,CTR ADV MAT/BERKELEY//CA/94720 | JOURNAL OF
APPLIED PHYSICS, 1990, V67, N10, P6141-6152 |
| SURFACE
GREEN-FUNCTION APPROACH TO THE CALCULATION OF TUNNELING CURRENTS IN NORMAL
METAL SUPERCONDUCTOR JUNCTIONS | LOUIS E; VERGES JA; GUINEA F
| UNIV ALICANTE,DEPT FIS APLICADA,APARTADO 99/E-03080
ALICANTE//SPAIN/; CTR INVEST &
DESARROLLO IND ESPANOLA ALUMINIO/E-03080 ALICANTE//SPAIN/; UNIV AUTONOMA
MADRID,CSIC,INST CIENCIA MAT/E-28049 MADRID//SPAIN/ | JOURNAL OF
PHYSICS-CONDENSED MATTER, 1990, V2, N18, P4143-4152 |
| A
NOVEL ULTRAHIGH-VACUUM SCANNING TUNNELING MICROSCOPE FOR SURFACE SCIENCE
STUDIES | HAASE O; BORBONUS M; MURALT P; KOCH R; RIEDER KH
| FREE UNIV BERLIN,INST EXPTL PHYS,ARNIMALLE 14/D-1000 BERLIN
33//FED REP GER/ | REVIEW OF SCIENTIFIC INSTRUMENTS, 1990, V61, N5,
P1480-1483 |
| POSITIONING SINGLE ATOMS WITH A SCANNING
TUNNELING MICROSCOPE | EIGLER DM; SCHWEIZER EK | IBM
CORP,ALMADEN RES CTR,DIV RES,650 HARRY RD/SAN JOSE//CA/95120
| NATURE, 1990, V344, N6266, P524-526 |
| DESIGN
AND DETAILED ANALYSIS OF A SCANNING TUNNELING MICROSCOPE |
GRAFSTROM S; KOWALSKI J; NEUMANN R | UNIV HEIDELBERG,INST
PHYS,PHILOSOPHENWEG 12/D-6900 HEIDELBERG//FED REP GER/
| MEASUREMENT SCIENCE & TECHNOLOGY, 1990, V1, N2, P139-146
|
| APPLICATION OF SCANNING TUNNELING MICROSCOPY FOR
CRYSTALLIZATION STUDIES OF METALLIC GLASSES | ZALUSKA A; ZALUSKI
L; WITEK A | MCGILL UNIV,DEPT PHYS,3600 UNIV ST/MONTREAL
H3A2T8/QUEBEC/CANADA/; POLISH ACAD SCI,INST PHYS/PL-02668
WARSAW//POLAND/; WARSAW POLYTECH INST,INST MAT SCI & ENGN/PL-02524
WARSAW//POLAND/ | MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL
MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 1989, V122, N2,
P251-255 |
| EVALUATION OF ELASTIC EMISSION MACHINED
SURFACES BY SCANNING TUNNELING MICROSCOPY | MORI Y; YAMAUCHI K;
ENDO K; IDE T; TOYOTA H; NISHIZAWA K; HASEGAWA M | OSAKA UNIV,FAC
ENGN/SUITA/OSAKA 565/JAPAN/ | JOURNAL OF VACUUM SCIENCE &
TECHNOLOGY A-VACUUM SURFACES AND FILMS , 1990, V8, N1, P621-624 |
| SCANNING TUNNELING MICROSCOPY OF SILVER CONTAINING SALT OF
BIS(ETHYLENEDITHIO)TETRATHIAFULVALENE | BAI C; DAI C; ZHU C; CHEN
Z; HUANG G; WU X; ZHU D; BALDESCHWIELER JD | ACAD SINICA,INST
CHEM/BEIJING 100080//PEOPLES RCHINA/; CAL TECH/PASADENA//CA/91125
| JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND
FILMS , 1990, V8, N1, P484-487 |
| HIGH PHI-VALUES IN
SCANNING TUNNELING MICROSCOPY - FIELD-EMISSION AND TUNNEL REGIMES
| GOMEZHERRERO J; GOMEZRODRIGUEZ JM; GARCIA R; BARO AM
| UNIV AUTONOMA MADRID,DEPT FIS MAT CONDENSADA CIII/E-28049
MADRID//SPAIN/ | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM
SURFACES AND FILMS , 1990, V8, N1, P445-449 |
| A
SUPERCONDUCTING ACTUATOR USING THE MEISSNER EFFECT | KIM YK;
KATSURAI M; FUJITA H | UNIV TOKYO,FAC ENGN,DEPT ELECT ENGN,7-3-1
HONGO,BUNKYO KU/TOKYO 113//JAPAN/; UNIV TOKYO,INST IND SCI,MINATO KU/TOKYO
106//JAPAN/ | SENSORS AND ACTUATORS, 1989, V20, N1-2, P33-40
|
| MINERALOGY IN 2 DIMENSIONS - SCANNING TUNNELING
MICROSCOPY OF SEMICONDUCTING MINERALS WITH IMPLICATIONS FOR GEOCHEMICAL
REACTIVITY | HOCHELLA MF; EGGLESTON CM; ELINGS VB; PARKS GA; BROWN
GE; WU CM; KJOLLER K | STANFORD UNIV,DEPT GEOL/STANFORD//CA/94305;
STANFORD UNIV,DEPT APPL EARTH SCI/STANFORD//CA/94305; DIGITAL INSTRUMENTS
INC/SANTA BARBARA//CA/93117 | AMERICAN MINERALOGIST, 1989, V74,
N11-1, P1233-1246 |
| SCANNING TUNNELING MICROSCOPY
MEASUREMENTS OF CARBON DEPOSITED ON TO GRAPHITE | NAKAGIRI N;
KAIZUKA H | YOSHIDA NANO MECHANISM PROJECT,JRDC 5-9-9 TOHKOHDAI
TSUKUBA/IBARAKI 30026//JAPAN/ | JOURNAL OF MICROSCOPY-OXFORD, 1989,
V156, DEC, P267-272 |
| DIRECT OBSERVATION OF ATOMS ON
SURFACES BY SCANNING TUNNELING MICROSCOPY | BALDESCHWIELER JD
| CALTECH,DIV CHEM & CHEM ENGN/PASADENA//CA/91125 | SOUTH
AFRICAN JOURNAL OF SCIENCE, 1989, V85, N9, P585-588 |